AP130N10HPIT

100V N-Channel Enhancement Mode MOSFET

AP130N10HP/T REV1.0

永源微電子科技有限公司

Electrical Characteristics (TC=25℃unless otherwise noted)

Symbol

Parameter

Test Conditions

Min.

Typ.

Max.

Unit

VDSS

Drain-Source Breakdown Voltage

VGS = 0V, ID = 250µA

100

-

-

V

lGSS

Gate-body Leakage current

VDS = 0V, VGS = ±20V

-

-

±100

nA

IDSS

Zero Gate Voltage Drain Current TJ=25°C

VDS =100V, VGS = 0V

-

-

1

μA

IDSS

Zero Gate Voltage Drain Current TJ=100°C

-

-

100

VGS(th)

Gate-Threshold Voltage

VDS = VGS, ID = 250µA

2.0

2.9

4.0

V

RDS(on)

Drain-Source on-Resistance2

VGS = 10V, ID = 20A

-

4.2

6

mΩ

Ciss

Input Capacitance

VDS = 50V, VGS =0V,

f =1MHz

-

2604

-

pF

Coss

Output Capacitance

-

567

-

Crss

Reverse Transfer Capacitance

-

9.6

-

Rg

Gate Resistance

VGS = 0V, VDS = 0V,

f =1MHz

-

1.8

-

Ω

Qg

Total Gate Charge

VGS = 10V, VDS = 50V,

ID=20A

-

42

-

nC

Qgs

Gate-Source Charge

-

6.5

-

Qgd

Gate-Drain Charge

-

9.7

-

td(on)

Turn-on Delay Time

VGS =10V, VDS =50V, RG =

3Ω, ID= 20A

-

11.3

-

ns

tr

Rise Time

-

17.6

-

td(off)

Turn-off Delay Time

-

46

-

tf

Fall Time

-

36

-

VSD

Diode Forward Voltage2

IF = 20A, VGS = 0V

-

-

1.2

V

IS

Continuous Source Current1,5

VG=VD=0V , Force Current

-

-

150

A

trr

Body Diode Reverse Recovery Time

IF = 20A, dI/dt=100A/µs

-

49

-

ns

Qrr

Body Diode Reverse Recovery Charge

-

44

-

nC

Notes:

1、The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.

2、The data tested by pulsed , pulse width ≤ 300us , duty cycle ≤ 2%

3、The EAS data shows Max. rating . The test condition is VDD=50V, VGS=10V, L=0.4mH, IAS=42A

4、The power dissipation is limited by 150°C junction temperature

5、The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.