28C16 datasheet(6/18 Pages) STMICROELECTRONICS

6 / 18 page

Symbol

Parameter

Test Condition

Min

Max

Unit

CIN

Input Capacitance

VIN =0V

COUT

Output Capacitance

VOUT =0V

Note: 1. Sampled only, not 100% tested.

Table 5. Capacitance (1) (TA =25

°C, f = 1 MHz )

Symbol

Parameter

Test Condition

Min

Max

Unit

ILI

Input Leakage Current

≤ VIN ≤ VCC

µA

ILO

Output Leakage Current

≤ VIN ≤ VCC

µA

ICC

(1)

Supply Current (TTL inputs)

E = VIL,G = VIL , f = 5 MHz

Supply Current (CMOS inputs)

E = VIL,G = VIL , f = 5 MHz

ICC1

(1)

Supply Current (Standby) TTL

E = VIH

1mA

ICC2

(1)

Supply Current (Standby) CMOS

E > VCC –0.3V

100

µA

VIL

Input Low Voltage

– 0.3

0.8

VIH

Input High Voltage

VCC +0.5

VOL

Output Low Voltage

IOL = 2.1 mA

0.4

VOH

Output High Voltage

IOH = –400

µA

2.4

Note: 1. All I/O’s open circuit.

Table 6. Read Mode DC Characteristics (TA = 0 to 70

°C or –40 to 85°C; VCC = 4.5V to 5.5V)

Symbol

Parameter

Min

Max

Unit

tPUR

Time Delay to Read Operation

µs

tPUW

Time Delay to Write Operation (once VCC

≥ 4.5V)

VWI

Write Inhibit Threshold

3.0

4.2

Note: 1. Sampled only, not 100% tested.

Table 7. Power Up Timing (1) (TA = 0 to 70

°C or –40 to 85°C; VCC = 4.5V to 5.5V)

Input Rise and Fall Times

≤ 20ns

Input Pulse Voltages

0.4V to 2.4V

Input and Output Timing Ref. Voltages

0.8V to 2.0V

Note that Output Hi-Z is defined as the point where data is no

longer driven.

Table 4. AC Measurement Conditions

AI00826

2.4V

0.4V

2.0V

0.8V

Figure 7. AC Testing Input Output Waveforms

AI01129

1.3V

OUT

CL = 30pF

CL includes JIG capacitance

3.3k

Ω

1N914

DEVICE

UNDER

TEST

Figure 8. AC Testing Equivalent Load Circuit

6/18

M28C16

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