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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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M24M01 датащи(PDF) 11 Page - STMicroelectronics |
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M24M01 датащи(HTML) 11 Page - STMicroelectronics |
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11 / 19 page  11/19 M24M01 MAXIMUM RATING Stressing the device above the rating listed in the Absolute Maximum Ratings" table may cause per- manent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not im- plied. Exposure to Absolute Maximum Rating con- ditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality docu- ments. Table 4. Absolute Maximum Ratings Note: 1. IPC/JEDEC J-STD-020A 2. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 Ω, R2=500 Ω) Symbol Parameter Min. Max. Unit TSTG Storage Temperature –65 150 °C TLEAD Lead Temperature during Soldering LGA: 20 seconds (max) 1 235 °C VIO Input or Output range –0.6 4.2 V VCC Supply Voltage –0.3 4.2 V VESD Electrostatic Discharge Voltage (Human Body model) 2 –3000 3000 V |
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