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L9704 датащи(PDF) 3 Page - STMicroelectronics |
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L9704 датащи(HTML) 3 Page - STMicroelectronics |
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3 / 8 page ![]() ELECTRICAL CHARACTERISTICS (5V ≤ VS ≤ 25V; -40°C ≤ Tj ≤ 125°C; 4.75V ≤ VCC ≤ 5.25V unless otherwise specified; the currents flowing in the arrow direction are assumed positive as marked in the application circuit diagram, fig. 1). Symbol Parameter Test Conditions Min. Typ. Max. Unit VENL Enable Input Voltage LOW (device activated) 0.8 V VENH Enable Input Voltage HIGH 2.4 V VEN hyst Enable Input Hysteresis 200 300 800 mV IEN Enable Input Current 2.4V < VEN <VCC 5 µA 0V < VEN < 0.8V -5 -1 µA VOUTH Output Voltage HIGH 0 < IOUT < 100 µA 4.0 VCC -0.1 VCC V VOUTL Output Voltage LOW IOUT = -1mA 0.05 0.2 0.4 V IOUT TS Output TRISTATE Current 0 < VOUT <VCC 0.5 µA VIN Input Voltage (device active) EN = LOW RIN =1k Ω 0.4 1.5 2 V VIN Input Voltage During Clamping (device disabled) EN = HIGH IIN = 30mA IIN = -30mA VS + 0.3 -2 VS +1 -1 VS +2 -0.3 V V IOUT Output Current OUT = HIGH VOUT =0 2mA IOUT Output Current OUT = LOW VOUT = 5.5V -20 mA RIL Input Resistor (note 1) LOW Threshold 5V < VS < 16V ∆ VGND ≤ 0.1VS 1.1 4.8 K Ω RIH Input Resistor (note 1) HIGH Threshold 6.5 29 K Ω Input Resistor Threshold Ratio (note1) 0.65 0.75 0.85 IQC Quiescent Current EN = HIGH (tENH ≥ 80µs) 5V < VS < 16V -40 °C ≤ Tj ≤ 100°C All Inputs Open 0.12 0.16 mA IQS 0.04 mA SIIN 2) Input Leakage Current All Inputs Closed VBAT ≤ VD1 0.24 mA IQC IQS Quiescent Current EN = LOW 13 2 mA mA tdo Delay Time/Output (EN LOW to output data ready) COUT ≤ 50pF 15 +3RIN CIN µs tdTS Delay Time/Tristate (EN HIGH to output TRISTAT E) COUT ≤ 50pF 10 µs Notes : 1. The input resi stor threshold valu e is a resistor value from the IN–pin to battery at which the corresponding output changes itsstatus(see fig. 3) 2: SIIN is the sum of the in put curr ents SIIN = ∑ i = 1 8 IIN1. RIL RIH L9704 3/8 |
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