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L9362 датащи(PDF) 14 Page - STMicroelectronics |
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L9362 датащи(HTML) 14 Page - STMicroelectronics |
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14 / 17 page ![]() L9362 14/17 Short-Circuit and Overtemperature Protection (SCB) If the output current increases above the short current limit for a longer time than t_SCB or if the temperature increases above TOFF, then the power transistor is immediately switched off. It remains switched off until the control signal at the NON-Input is switched off and on again. This filter time has the purpose to suppress wrong detection on short spikes. All four outputs have an independent overtemperature detection and shutdown. This measurement is active while the powerstage is switched on. The Short circuit detection and the overtemperature detection are using the same bit in the Diagnostic (one for each channel). A SCG failure will be recognized, when the drain voltage of the output stage is lower as the “Short Cut to Ground threshold voltage”, while the output stage is switched off (see Fig. 4). The SCG failure is filtered with a digital filter (t_SCG) to suppress the storage of a failure at small SCG spikes, which are typical during the transition of the power output. This filter is triggered by the NON input and the (analog) SCG detection. If the current through the output stage is lower than the IOL-reference, then an OL failure will be recognized after a filter time. This measurement is active while the powerstage is switched on. The Open Load failure detection has 2 different modes, the statical failure detection and the sporadic failure detection. One main difference is, that a statical failure is transferred to the Failure register with the next rising edge of NON, whereas a sporadic failure is transferred immediately to the Failure register (see fig. 5, 6 and 7). In both failure modes the OL detection is filtered (t_OL=tOL) and is using together with the SCG detection the same digital filter for suppression of spikes. The failures are stored regarding to their priority (see above). A failure with a higher priority overwrites an even- tually already detected failure with a lower priority. Diagnostic interface The communication between the microprocessor and the failure register runs via the SPI link. If there is a failure stored in the failure register, the first bit of the shift register is set to a high level. With the H/L change at the NCS pin the first bit of the diagnostic shift register will be transmitted to the SDO output. The SDO output is the serial output from the diagnostic shift register and it is tristate when the NCS pin is high. The CLK pin clocks the diag- nostic shift register. New SDO data will appear on every rising edge of the CLK pin and new SDI data will be latched on every falling edge into the shift register. With the first positive pulse of the CLK the contents of the failure register is copied to the SPI shift register and a internal reset (FR_RESET) is generated. This internal reset clears the failure register and thus the failure register is capable of detecting failures also during the SPI read cycle. There is no bus collision at a small spike at the NCS. The CLK has to be LOW, while the NCS signal is changing. Current feedback Each channel has a current feedback output which sinks a current proportional to the load current of the Low Side Switch. Using this output servo loop applications can be realized by applying a PWM signal to the NON input. A typical diagram of the Current Feedback output at different temperatures is shown in figure 9. |
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