STM32L433CB datasheet(110/227 Pages) STMICROELECTRONICS

номер детали	STM32L433CB

подробное описание детали	Ultra-low-power Arm® Cortex®-M4 32-bit MCUFPU, 100DMIPS, up to 256KB flash, 64KB SRAM, USB FS, LCD, ext. SMPS

PDF	227 Pages

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производитель	STMICROELECTRONICS [STMicroelectronics]

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110 / 227 page

Electrical characteristics

STM32L433xx

110/19

DS11449 Rev 7

Table 35. Typical current consumption in Run and Low-power run modes, with different codes

running from flash, ART disable

Symbol

Parameter

Conditions

TYP

Unit

TYP

Unit

Voltage

scaling

Code

25 °C

IDD_ALL

(Run)

Supply

current in

Run mode

fHCLK = fHSE up to

48 MHz included,

bypass mode

PLL ON above

48 MHz

all peripherals

disable

Reduced code(1)

2.66

102

µA/MHz

Coremark

2.44

Dhrystone 2.1

2.46

Fibonacci

2.27

While(1)

2.20

84.6

Reduced code(1)

8.56

107

µA/MHz

Coremark

8.00

100

Dhrystone 2.1

7.98

100

Fibonacci

7.41

While(1)

7.83

IDD_ALL

(LPRun)

Supply

current in

Low-power

run

fHCLK = fMSI = 2 MHz

all peripherals disable

Reduced code(1)

310

µA

155

µA/MHz

Coremark

342

171

Dhrystone 2.1

324

162

Fibonacci

324

162

While(1)

384

192

1. Reduced code used for characterization results provided in Table 26, Table 28, Table 30.

Table 36. Typical current consumption in Run modes, with different codes running from

flash, ART disable and power supplied by external SMPS (VDD12 = 1.10 V)

Symbol

Parameter

Conditions(1)

TYP

Unit

TYP

Unit

Voltage

scaling

Code

25 °C

IDD_ALL

(Run)

Supply

current in

Run mode

fHCLK = fHSE up to

48 MHz included,

bypass mode

PLL ON above

48 MHz

all peripherals

disable

Reduced code(2)

1.15

µA/MHz

Coremark

1.05

Dhrystone 2.1

1.06

Fibonacci

0.98

While(1)

0.95

Reduced code(2)

3.08

Coremark

2.88

Dhrystone 2.1

2.87

Fibonacci

2.66

While(1)

2.81

1. All values are obtained by calculation based on measurements done without SMPS and using following parameters: SMPS

input = 3.3 V, SMPS efficiency = 85%, VDD12 = 1.10 V

2. Reduced code used for characterization results provided in Table 26, Table 28, Table 30.

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