ADIS16060

Rev. 0 | Page 11 of 12

APPLICATIONS INFORMATION

SUPPLY AND COMMON CONSIDERATIONS

Power supply noise and transient behaviors can influence the

accuracy and stability of any sensor-based measurement system.

The ADIS16060 provides 0.2 μF of decoupling capacitance on

power supply of the system, the ADIS16060 may not require

any additional decoupling capacitance for this supply.

SETTING BANDWIDTH

bandwidth of the ADIS16060 rate response. The –3 dB

()

OUT

OUT

OUT

C

R

f

×

×

×

=

π

2

1

during manufacturing to be 200 kΩ ± 5%. Setting the range

(

)

()

EXT

EXT

OUT

R

R

R

+

×

=

kΩ

200

kΩ

200

In general, an additional hardware or software filter is added to

attenuate high frequency noise arising from demodulation spikes

at the gyro’s 14 kHz resonant frequency. The noise spikes at 14 kHz

can be clearly seen in the power spectral density curve shown in

Figure 14.

INCREASING MEASUREMENT RANGE

Scaling the measurement range requires the addition of a single

resistor, connected across the RATE and FILT pins. The following

equation provides the proper relationship for selecting the

appropriate resistor:

1

kΩ

200

−

Δ

=

EXT

R

where Δ is the increase in range.

1

0.1

0.01

0.001

0.0001

10

100

100k

1k

10k

FREQUENCY (Hz)

Figure 14. Noise Spectral Density with 2-Pole, Low-Pass Filter (40 Hz and 250 Hz)

DYNAMIC DIGITAL SENSITIVITY SCALING

This device supports in-system, dynamic, digital sensitivity scaling.

TEMPERATURE MEASUREMENTS

When using the temperature sensor, an acquisition time of

greater than 40 μs helps to ensure proper setting and measurement

accuracy. See Table 2 and Figure 2 for details on the definition

of acquisition time.

SELF-TEST FUNCTION

Exercising the self-test function is simple, as shown in this

example.

1.

Configure using DIN = 00100010 (positive self-test,

rate selected).

2.

Read output.

3.

Configure using DIN = 00100000 (positive self-test off,

rate selected)

4.

Read output.

5.

Calculate the difference between Step 2 and Step 4, and

compare this with the specified self-test output changes in

the Specifications section.

Exercising the negative self-test requires changing the sequence

in Step 1 to DIN = 00100001.