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TMUX1574

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SCDS391C – OCTOBER 2018 – REVISED DECEMBER 2019

Product Folder Links: TMUX1574

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12 Device and Documentation Support

12.1 Documentation Support

12.1.1 Related Documentation

Texas Instruments, Improve Stability Issues with Low CON Multiplexers.

Texas Instruments, Enabling SPI-based flash memory expansion by using multiplexers.

Texas Instruments, Simplifying Design with 1.8 V logic Muxes and Switches.

Texas Instruments, Eliminate Power Sequencing with Powered-off Protection Signal Switches.

Texas Instruments, System-Level Protection for High-Voltage Analog Multiplexers.

Texas Instruments, High-Speed Interface Layout Guidelines.

Texas Instruments, High-Speed Layout Guidelines.

Texas Instruments, QFN/SON PCB Attachment.

Texas Instruments, Quad Flatpack No-Lead Logic Packages.

12.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper

right corner, click on Alert me to register and receive a weekly digest of any product information that has

changed. For change details, review the revision history included in any revised document.

12.3 Community Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight

from the experts. Search existing answers or ask your own question to get the quick design help you need.

Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do

not necessarily reflect TI's views; see TI's Terms of Use.

12.4 Trademarks

E2E is a trademark of Texas Instruments.

12.5 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

12.6 Glossary

SLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.