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LP2997 датащи(PDF) 8 Page - Texas Instruments |
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LP2997 датащи(HTML) 8 Page - Texas Instruments |
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8 / 28 page ![]() V TT LP2997 PV IN V DD Q V REF AV IN V REF = 0.9V V SENSE GND + + + AV IN = 2.5V V TT = 0.9V SD SD V DD Q = 1.8V 7 P F 0.01 PF P 22 0 F LP2997 SNVS295F – MAY 2004 – REVISED APRIL 2013 www.ti.com Additional improvements can be made by the judicious use of vias to connect the part and dissipate heat to an internal ground plane. Using larger traces and more copper on the top side of the board can also help. With careful layout it is possible to reduce the θJA further than the nominal values shown in Figure 13. Optimizing the θJA and placing the LP2997 in a section of a board exposed to lower ambient temperature allows the part to operate with higher power dissipation. The internal power dissipation can be calculated by summing the three main sources of loss: output current at VTT, either sinking or sourcing, and quiescent current at AVIN and VDDQ. During the active state (when shutdown is not held low) the total internal power dissipation can be calculated from the following equations: PD = PAVIN + PVDDQ + PVTT (3) Where, PAVIN = IAVIN * VAVIN (4) PVDDQ = VVDDQ * IVDDQ = VVDDQ2 x RVDDQ (5) To calculate the maximum power dissipation at VTT both conditions at VTT need to be examined, sinking and sourcing current. Although only one equation will add into the total, VTT cannot source and sink current simultaneously. PVTT = VVTT x ILOAD (Sinking) or (6) PVTT = ( VPVIN - VVTT) x ILOAD (Sourcing) (7) The power dissipation of the LP2997 can also be calculated during the shutdown state. During this condition the output VTT will tri-state, therefore that term in the power equation will disappear as it cannot sink or source any current (leakage is negligible). The only losses during shutdown will be the reduced quiescent current at AVIN and the constant impedance that is seen at the VDDQ pin. PD = PAVIN + PVDDQ (8) PAVIN = IAVIN x VAVIN (9) PVDDQ = VVDDQ * IVDDQ = VVDDQ2 x RVDDQ (10) Typical Application Circuits Several different application circuits have been shown to illustrate some of the options that are possible in configuring the LP2997. Graphs of the individual circuit performance can be found in the Typical Performance Characteristics section in the beginning of the datasheet. These curves illustrate how the maximum output current is affected by changes in AVIN and PVIN. Figure 14 shows the recommended circuit configuration for DDR-II applications. The output stage is connected to the 1.8V rail and the AVIN pin can be connected to either a 2.5V, 3.3V or 5V rail. This circuit permits termination in a minimum amount of board space and component count. Capacitor selection can be varied depending on the number of lines terminated and the maximum load transient. However, with motherboards and other applications where VTT is distributed across a long plane it is advisable to use multiple bulk capacitors and addition to high frequency decoupling. The bulk output capacitors should be situated at both ends of the VTT plane for optimal placement. Large aluminum electrolytic capacitors are used for their low ESR and low cost. Figure 14. Recommended DDR-II Termination 8 Submit Documentation Feedback Copyright © 2004–2013, Texas Instruments Incorporated Product Folder Links: LP2997 |
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