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ISO7840 датащи(PDF) 6 Page - Texas Instruments |
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ISO7840 датащи(HTML) 6 Page - Texas Instruments |
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6 / 37 page ![]() 5.6 Insulation Specifications PARAMETER TEST CONDITIONS SPECIFICATION DW DWW UNIT GENERAL CLR External clearance(1) Shortest pin-to-pin distance through air >8.15 >14.5 mm Shortest pin-to-pin distance through air (typical) 15.0 mm CPG External creepage(1) Shortest pin-to-pin distance across the package surface >8.15 >14.5 mm Shortest pin-to-pin distance across the package surface (typical) 15.0 mm DTI Distance through the insulation Minimum internal gap (internal clearance) >21 >21 μm CTI Comparative tracking index DIN EN 60112 (VDE 0303-11); IEC 60112; UL 746A >600 >600 V Material group I I Overvoltage category per IEC 60664-1 Rated mains voltage ≤ 600VRMS I–IV I–IV Rated mains voltage ≤ 1000VRMS I–III I–IV DIN EN IEC 60747-17 (VDE 0884-17)(2) VIORM Maximum repetitive peak isolation voltage 2121 2828 VPK VIOWM Maximum isolation working voltage AC voltage (sine wave); Time dependent dielectric breakdown (TDDB) Test, see Figure 5-1 and Figure 5-2 1500 2000 VRMS DC voltage 2121 2828 VDC VIOTM Maximum transient isolation voltage VTEST = VIOTM, t = 60s (qualification) VTEST = 1.2 x VIOTM, t= 1s (100% production) 8000 8000 VPK VIMP Maximum impulse voltage (3) Tested in air, 1.2/50μs waveform per IEC 62368-1 9800 9800 VPK VIOSM Maximum surge isolation voltage (4) VIOSM ≥ 1.3 x VIMP; Tested in oil (qualification test), 1.2/50-μs waveform per IEC 62368-1 12800 12800 VPK qpd Apparent charge (5) Method a: After I/O safety test subgroup 2/3, Vini = VIOTM, tini = 60s; Vpd(m) = 1.2 × VIOTM = 2545VPK (DW) and 3394VPK (DWW), tm = 10s ≤5 ≤5 pC Method a: After environmental tests subgroup 1, Vini = VIOTM, tini = 60s; Vpd(m) = 1.6 × VIORM = 3394VPK (DW) and 4525VPK (DWW), tm = 10s ≤5 ≤5 Method b: At routine test (100% production); Vini = 1.2 x VIOTM, tini = 1s; Vpd(m) = 1.875 x VIORM, tm = 1s (method b1) or Vpd(m) = Vini, tm = tini (method b2) ≤5 ≤5 CIO Barrier capacitance, input to output(6) VIO = 0.4 × sin (2πft), f = 1MHz 2 2 pF RIO Isolation resistance, input to output (6) VIO = 500V, TA = 25°C >1012 >1012 Ω VIO = 500V, 100°C ≤ TA ≤ 125°C >1011 >1011 VIO = 500V at TS = 150°C >109 >109 Pollution degree 2 2 Climatic category 55/125/21 55/125/21 UL 1577 VISO Withstand isolation voltage VTEST = VISO = 5700VRMS, t = 60s (qualification), VTEST = 1.2 × VISO = 6840VRMS, t = 1s (100% production) 5700 5700 VRMS (1) Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Care should be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator on the printed-circuit board do not reduce this distance. Creepage and clearance on a printed-circuit board become equal ISO7840, ISO7840F SLLSEN2C – JULY 2015 – REVISED JULY 2025 www.ti.com 6 Submit Document Feedback Copyright © 2025 Texas Instruments Incorporated Product Folder Links: ISO7840 ISO7840F |
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