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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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STA7360 датащи(PDF) 11 Page - STMicroelectronics |
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STA7360 датащи(HTML) 11 Page - STMicroelectronics |
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11 / 28 page  STA7360 Electrical specifications Doc ID 9814 Rev 4 11/28 Figure 7. Bridge test and application circuit Figure 8. Board and layout of the bridge test and application circuit (1:1 scale) C5 220 µF (min) Supply bypass Danger of oscillation C6 100 nF (min) Supply bypass Danger of oscillation C7 2200 µF Output decoupling (CH2) -Decrease of low-frequency cutoff -Longer turn-on delay -Increase of low-frequency cutoff -Shorter turn-on delay C8 2200 µF Output decoupling (CH1) -Decrease of low-frequency cutoff -Longer turn-on delay -Increase of low-frequency cutoff -Shorter turn-on delay Table 5. Recommended values of the external components (stereo test and application circuit) Comp. Recommended value Purpose Larger than the recommended value Smaller than the recommended value C4 1 µF 220 µF C5 100nF C6 +VS 9 11 7 STAND-BY SVR 22 µF C3 5 IN2(+) 0.22 µF C2 1 IN1(+) 0.22 µF C1 IN 8 10 OUT2 OUT1 4 OUT BRIDGE 6 3 P-GND CLIP DET D00AU1213 RL 20K 2 S-GND Obsolete Product(s) - Obsolete Product(s) |
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