9 Device and Documentation Support

9.1 Related Documentation

For related documentation, see the following:

• Texas Instruments, LSF Translator Family Evaluation Module user's guide

• Texas Instruments, Biasing Requirements for TXS, TXB, and LSF Auto-Bidirectional Translators application

note

• Texas Instruments, Voltage Level Translation with the LSF Family application note

• The Logic Minute Video Training Series on Understanding the LSF Family of Devices:

– Texas Instruments, Introduction - Voltage Level Translation with the LSF Family

– Texas Instruments, Understanding the Bias Circuit for the LSF Family

– Texas Instruments, Using the Enable Pin with the LSF Family

– Texas Instruments, Translation Basics with the LSF Family

– Texas Instruments, Down Translation with the LSF Family

– Texas Instruments, Up Translation with the LSF Family

– Texas Instruments, Multi-Voltage Translation with the LSF Family

– Texas Instruments, Single Supply Translation with the LSF Family

9.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on

Notifications to register and receive a weekly digest of any product information that has changed. For change

details, review the revision history included in any revised document.

9.3 Support Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight

from the experts. Search existing answers or ask your own question to get the quick design help you need.

Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do

not necessarily reflect TI's views; see TI's Terms of Use.

9.4 Trademarks

TI E2E™ is a trademark of Texas Instruments.

All trademarks are the property of their respective owners.

9.5 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled

with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may

be more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

9.6 Glossary

TI Glossary

This glossary lists and explains terms, acronyms, and definitions.

10 Revision History

DATE

REVISION

NOTES

April 2024

*

Initial Release

11 Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the most

current data available for the designated devices. This data is subject to change without notice and revision of

this document. For browser-based versions of this data sheet, refer to the left-hand navigation.

www.ti.com

LSF0002

SDLS975 – APRIL 2024

Copyright © 2024 Texas Instruments Incorporated

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