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LP5900 датащи(PDF) 12 Page - Texas Instruments

номер детали LP5900
подробное описание детали  LP5900 150-mA Ultra-Low-Noise LDO for RF and Analog Circuits - Requires No Bypass Capacitor
PDF  29 Pages
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производитель  TI2 [Texas Instruments]
домашняя страница  https://www.ti.com
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LP5900 датащи(HTML) 12 Page - Texas Instruments

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IN
EN
GND
OUT
OUTPUT
0.47 PF
0.47 PF
INPUT
ENABLE
GND
LP5900
12
LP5900
SNVS358R – JULY 2005 – REVISED JUNE 2016
www.ti.com
Product Folder Links: LP5900
Submit Documentation Feedback
Copyright © 2005–2016, Texas Instruments Incorporated
8 Application and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
8.1 Application Information
The LP5900 is a linear regulator capable of supplying a 150-mA output current. Designed to meet the
requirements of RF and nalog circuits, the device provides low noise, high PSRR, low quiescent current, and low
line transient response figures. Using new innovative design techniques the LP5900 offers class-leading device
noise performance and is designed to work with 0.47-
μF input and output ceramic capacitors (no bypass
capacitor is required).
8.2 Typical Application
Figure 16 shows the typical application circuit for the LP5900. Input and output capacitances may need to be
increased above the 0.47-
μF minimum for some applications.
Figure 16. LP5900 Typical Application
8.2.1 Design Requirements
DESIGN PARAMETER
MIN
MAX
UNITS
Input voltage range
2.5
5.5
V
Output voltage
2.8
V
Output current
150
mA
Output capacitor range
0.47
10
μF
Input/Output capacitor ESR range
5
500
m
Ω
8.2.2 Detailed Design Procedure
8.2.2.1 Power Dissipation
The permissible power dissipation for any package is a measure of the capability of the device to pass heat from
the power source, the junctions of the device, to the ultimate heat sink, the ambient environment. Thus the power
dissipation is dependent on the ambient temperature and the thermal resistance across the various interfaces
between the die and ambient air. As stated in Recommended Operating Conditions, the allowable power
dissipation for the device in a given package can be calculated using Equation 1:



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