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CDCM1802RGTT датащи(PDF) 21 Page - Texas Instruments |
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CDCM1802RGTT датащи(HTML) 21 Page - Texas Instruments |
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21 / 30 page ![]() 21 CDCM1802 www.ti.com SCAS759C – APRIL 2004 – REVISED JULY 2017 Product Folder Links: CDCM1802 Submit Documentation Feedback Copyright © 2004–2017, Texas Instruments Incorporated (1) It is recommended to provide four thermal vias to connect the thermal pad of the package effectively with the PCB and ensure a good heat sink. 11.3 Thermal Considerations Table 2. Package Thermal Resistance PARAMETER TEST CONDITIONS MIN TYP MAX UNIT RθJA VQFN −16 package thermal resistance with thermal vias in PCB(1) 4-layer JEDEC test board (JESD51 −7) with four thermal vias of 22-mil diameter each, airflow = 0 ft/min 48.4 °C/W Example: Calculation of the junction-lead temperature with a 4-layer JEDEC test board using four thermal vias: TChassis = 85°C (temperature of the chassis) Peffective = Imax × Vmax = 85 mA × 3.6 V = 306 mW (max power consumption inside the package) ΔTJunction = RθJA × Peffective = 40.8°C/W × 306 mW = 12.48°C TJunction = ΔTJunction + TChassis = 12.48°C + 85°C = 97.48°C (the maximum junction temperature of Tdie−max = 125°C is not violated) |
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