LP2960

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SNVS112C – APRIL 1999 – REVISED APRIL 2013

LP2960 Adjustable Micropower 0.5A Low-Dropout Regulators

Check for Samples: LP2960

1

FEATURES

DESCRIPTION

The LP2960 is a micropower voltage regulator with

2

•

Output Voltage Adjusts from 1.23V–29V

very low dropout voltage (12 mV typical at 1 mA load

•

Ensured 500 mA Output Current

and 470 mV typical at 500 mA load) and very low

•

5V and 3.3V Versions Available

quiescent current (450

μA typical at 1 mA load).

•

16-Pin SO Package

The LP2960 is ideally suited for battery-powered

•

Low Dropout Voltage

systems: the quiescent current increases only slightly

at dropout, which prolongs battery life.

•

Low Quiescent Current

The LP2960 retains all the desirable characteristics of

•

Tight Line and Load Regulation

the LP2953, and offers increased output current.

•

Low Temperature Coefficient

The error flag goes low any time the output drops

•

Current Limiting and Thermal Protection

more than 5% out of regulation.

•

Logic-Level Shutdown

Reverse battery protection is provided.

•

Can be Wired for Snap-ON and Snap-OFF

•

Reverse Battery Protection

The

LP2960

requires

only

10

μF

of

output

capacitance for stability (5V version).

APPLICATIONS

The internal voltage reference is made available for

external use, providing a low-T.C. reference with very

•

High-Efficiency Linear Regulator

good regulation characteristics.

•

Regulator with Under-Voltage Shutdown

The part is available in a 16-pin surface mount

•

Low Dropout Battery-Powered Regulator

(SOIC) package.

•

Cellular Telephones

Block Diagram

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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 1999–2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.