4

LM61

SNIS121J – JUNE 1999 – REVISED NOVEMBER 2016

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Copyright © 1999–2016, Texas Instruments Incorporated

(1)

For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application

report.

(2)

The junction-to-ambient thermal resistance is specified without a heat sink in still air.

6.4 Thermal Information

THERMAL METRIC(1)

LM61

UNIT

DBZ (SOT-23)

LP (TO-92)

3 PINS

3 PINS

RθJA

Junction-to-ambient thermal resistance(2)

286.3

162.2

°C/W

RθJC(top)

Junction-to-case (top) thermal resistance

96

85

°C/W

RθJB

Junction-to-board thermal resistance

57.1

—

°C/W

ψJT

Junction-to-top characterization parameter

5.3

29.2

°C/W

ψJB

Junction-to-board characterization parameter

55.8

141.4

°C/W

(1)

Limits are specified to TI's AOQL (Average Outgoing Quality Level).

(2)

Typical limits represent most likely parametric norm.

(3)

Maximum and minimum limits apply for TA = TJ = TMIN to TMAX.

(4)

Typical limits apply for TA = TJ = 25°C.

(5)

Accuracy is defined as the error between the output voltage and 10 mV/°C multiplied by the device's case temperature plus 600 mV, at

specified conditions of voltage, current, and temperature (expressed in °C).

(6)

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's

rated temperature range.

(7)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

(8)

For best long-term stability, any precision circuit gives best results if the unit is aged at a warm temperature, or temperature cycled for at

least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered; allow time

for stress relaxation to occur. The majority of the drift occurs in the first 1000 hours at elevated temperatures. The drift after 1000 hours

does not continue at the first 1000-hour rate.

6.5 Electrical Characteristics

+VS = 3 V (DC)

(1) (2)

PARAMETER

TEST CONDITIONS

MIN(3)

TYP(4)

MAX(3)

UNIT

Accuracy(5)

TA = 25°C

LM61B

–2

2

°C

LM61C

–3

3

LM61B

–3

3

LM61C

–4

4

Output voltage at 0°C

600

mV

Nonlinearity(6)

LM61B

–0.6

0.6

°C

LM61C

–0.8

0.8

Sensor gain (average slope)

LM61B

9.7

10

10.3

mV/°C

LM61C

9.6

10

10.4

Output impedance

+VS = 3 V to 10 V

0.8

kΩ

TA = –30°C to 85°C, +VS = 2.7 V

2.3

TA = 85°C to 100°C, +VS = 2.7 V

5

Line regulation(7)

+VS = 3 V to 10 V

–0.7

0.7

mV/V

+VS = 2.7 V to 3.3 V

–5.7

5.7

mV

Quiescent current

+VS = 2.7 V to 10 V

TA = 25°C

82

125

µA

155

Change of quiescent current

+VS = 2.7 V to 10 V

±5

µA

Temperature coefficient of quiescent current

0.2

µA/°C

Long term stability(8)

TJ = TMAX = 100°C, for 1000 hours

±0.2

°C