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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ISO7340C датащи(PDF) 18 Page - Texas Instruments |
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ISO7340C датащи(HTML) 18 Page - Texas Instruments |
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18 / 38 page  C = 0.1 µF ±1% IN V OH or VOL OUT V CCI + – V CM V CCO GNDO GNDI S1 + – Pass-fail criteria – output must remain stable. C L See Note A C = 0.1 µF ±1% VO OUT IN IN = 0 V (Devices without suffix F) IN = V (Devices with suffix F) CC See Note A CL VI 0 V t fs fs high VO VI 2.7 V 50% VCC VCC VOL VOH fs low 18 ISO7340C, ISO7340FC, ISO7341C, ISO7341FC, ISO7342C, ISO7342FC SLLSEI6G – SEPTEMBER 2014 – REVISED JANUARY 2017 www.ti.com Product Folder Links: ISO7340C ISO7340FC ISO7341C ISO7341FC ISO7342C ISO7342FC Submit Documentation Feedback Copyright © 2014–2017, Texas Instruments Incorporated Parameter Measurement Information (continued) A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 16. Failsafe Delay Time Test Circuit and Voltage Waveforms A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 17. Common-Mode Transient Immunity Test Circuit |
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