Technical information

USBUFxxW6

6/11

Figure 8.

Remaining voltage at both stages S1 (Vinput) and S2 (Voutput) during

ESD surge

Please note that the USBUFxxW6 is not only acting for positive ESD surges but also for

negative ones. For these kinds of disturbances it clamps close to ground voltage as

shown in Figure 8. (negative surge.

2.4

Latch-up phenomena

The early ageing and destruction of IC’s is often due to latch-up phenomenon which is

mainly induced by dV/dt. Thanks to its structure, the USBUFxxW6 provides a high immunity

to latch-up phenomenon by smoothing very fast edges.

2.5

Crosstalk behavior

Figure 9.

Crosstalk phenomenon.

The crosstalk phenomenon is due to the coupling between 2 lines. The coupling factor (

or

has got an extra value

crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into

account when the drivers impose fast digital data or high frequency analog signals in the

disturbing line. The perturbed line will be more affected if it works with low voltage signal or

high load impedance (few k

Ω).

Vin

Vout

Vin

Vout

Positive surge

Negative surge

Line 1

Line 2

DRIVERS

RECEIVERS

αβ

1

G1

1 2

G2

V+

V

αβ

2

G2

2 1

G1

V+

V