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TLC59482RGET датащи(PDF) 7 Page - Texas Instruments |
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TLC59482RGET датащи(HTML) 7 Page - Texas Instruments |
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7 / 35 page ![]() V CC R IREF V OUTfix V OUTn OUT0 VCC OUTn (1) OUT15 GND IREF V CC VCC GND SOUT C L (1) V CC VCC GND IREF OUTn (1) R IREF R L C L (2) V LED TLC59482 www.ti.com SBVS218 – DECEMBER 2012 TEST CIRCUITS (1) n = 0 to 15. (2) CL includes measurement probe and jig capacitance. Figure 5. Rise Time and Fall Time Test Circuit for OUTn (1) CL includes measurement probe and jig capacitance. Figure 6. Rise Time and Fall Time Test Circuit for SOUT (1) n = 0 to 15. Figure 7. Constant-Current Test Circuit for OUTn Copyright © 2012, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: TLC59482 |
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