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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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S29GL032A датащи(PDF) 71 Page - SPANSION |
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S29GL032A датащи(HTML) 71 Page - SPANSION |
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71 / 95 page  September 10, 2007 S29GL-A_00_A11 S29GL-A 71 Data She e t 14. Test Conditions Figure 14.1 Test Setup Note Diodes are IN3064 or equivalent. 15. Key to Switching Waveforms Figure 15.1 Input Waveforms and Measurement Levels Table 14.1 Test Specifications Test Condition All Speeds Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5ns Input Pulse Levels 0.0 or VCC V Input timing measurement reference levels 0.5 VCC V Output timing measurement reference levels 0.5 VCC V 2.7 k Ω CL 6.2 k Ω 3.3 V Device Under Test Waveform Inputs Outputs Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VCC 0.0 V Output Measurement Level Input 0.5 VCC 0.5 VCC |
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