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DP8482A датащи(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
номер детали DP8482A
подробное описание детали  100k ECL to TTL Level Translator with Latch
PDF  6 Pages
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производитель  NSC [National Semiconductor (TI)]
домашняя страница  http://www.national.com
Logo NSC - National Semiconductor (TI)

DP8482A датащи(HTML) 2 Page - National Semiconductor (TI)

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Absolute Maximum Ratings (Note 1)
If MilitaryAerospace specified devices are required
please contact the National Semiconductor Sales
OfficeDistributors for availability and specifications
VEE Supply Voltage
b
8V
VCC Supply Voltage
7V
Input Voltage
GND to VEE
Output Voltage
55V
Maximum Power Dissipation at 25 C
Molded Package
1476 mW
Storage Temperature
b
65 Cto a150 C
Derate molded package 118 mW C above 25 C
Recommended Operating Conditions
VEE Supply Voltage
b
45Vg7%
VCC Supply Voltage
50Vg10%
TA Ambient Temperature
0 Cto85 C
Electrical Characteristics (TTL Logic) (Notes 2 3 and 4)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
VOL
Output Low Voltage
IOLe12 mA
05
V
VOH
Output High Voltage
IOHeb10 mA
VCCb2V
V
IAV
Output Low Drive Current
Force 25V
70
150
mA
IOS
Output High Drive Current
Force 0V
b
70
b
150
b
350
mA
IOZ
TRI-STATE Output Current
b
50
1
a
50
m
A
ICC
Supply Current
35
mA
Electrical Characteristics (ECL Logic) (Notes 2 and 3)
Symbol
Parameter
Conditions
TA
Min
Typ
Max
Units
VIL
Input Low Voltage
VEEeb45V
b
1810
b
1475
mV
VIH
Input High Voltage
VEEeb45V
b
1165
b
880
mV
IIL
Input Low Current
VIN e VIL Max
50
100
m
A
IIH
Input High Current
VIN e VIH Max
75
750
m
A
IEE
Supply Current
b
55
mA
Switching Characteristics (Notes 2 and 5)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
tPD1
Strobe to Output Delay
CLe50 pF
4
9
15
ns
tPD2
Data to Output Delay
CLe50 pF
35
8
15
ns
tS
Data Set-Up Time
(Note 6)
30
10
ns
tH
Data Hold Time
(Note 6)
30
10
ns
tPW
Strobe Pulse Width
(Note 6)
50
30
ns
tZE
Delay from Chip Select to
CLe50 pF
6
15
25
ns
Active State from Hi-Z State
tEZ
Delay from Chip Select to Hi-Z
CLe50 pF
45
12
22
ns
State from Active State
Note 1
‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed They are not meant to imply that the device
should be operated at these limits The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation
Note 2
Unless otherwise specified minmax limits apply across the 0 Cto85 C ambient temperature range in still air and across the specified supply variations
All typical values are for TAe25 C and nominal supply Maximum propagation delays are specified with all outputs switching simultaneously
Note 3
All currents into device pins are shown as positive all currents out of device pins are shown as negative All voltages are referenced to ground unless
otherwise specified
Note 4
When DC testing IAV or IOS only one output should be tested at a time and the current limited to 120 mA max
Note 5
Unless otherwise specified all AC measurements are referenced from the 50% level of the ECL input to the 08V level on negative transitions or the 24V
level on positive transitions of the output ECL input rise and fall times are 07 ns g 01 ns from 20% to 80%
Note 6
Caution should be used when latching data while the outputs are switching TTL outputs generate severe ground noise when switching This noise can be
sufficient to cause the ECL latch to lose data Board mounting and good supply decoupling are desirable The worst case conditions are with all outputs switching
low simultaneously the maximum capacitive loading on the outputs and the maximum VCC supply voltage applied
2



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