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LP38512 датащи(PDF) 2 Page - Texas Instruments |
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LP38512 датащи(HTML) 2 Page - Texas Instruments |
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2 / 22 page ![]() TAB IS GND OUT GND EN 1 2 3 4 5 IN ERROR Exposed DAP OUT GND EN 1 2 3 4 5 IN ERROR LP38512 SNOSAU7F – NOVEMBER 2007 – REVISED APRIL 2013 www.ti.com Connection Diagram Figure 1. Top View Figure 2. Top View DDPAK/TO-263 5 Pin Package PFM 5 Pin Package Table 1. Pin Descriptions for DDPAK/TO-263 and PFM Packages Pin # Pin Name Function Enable. Pull high to enable the output, low to disable the output. This pin has no internal bias 1 EN and must be tied to the input voltage, or actively driven. 2 IN Input Supply Pin 3 GND Ground 4 OUT Regulated Output Voltage Pin ERROR Flag. A high level indicates that VOUT is within typically 15% (VOUT falling) of the 5 ERROR nominal regulated voltage. The DDPAK/TO-263 TAB, and the PFM DAP, is used as a thermal connection to remove heat TAB/DAP TAB/DAP from the device to an external heatsink. The TAB/DAP is internally connected to device pin 3, and is electrical ground connection. These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) (2) Storage Temperature Range −65°C to +150°C Soldering Temperature (3) DDPAK/TO-263 235°C, 30s ESD Rating (4) ±2 kV Power Dissipation(5) Internally Limited Input Pin Voltage (Survival) −0.3V to +6.0V Enable Pin Voltage (Survival) −0.3V to +6.0V Output Pin Voltage (Survival) −0.3V to +6.0V ERROR Pin Voltage (Survival) 0.3V to +6.0V IOUT(Survival) Internally Limited (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is intended to be functional, but does not ensure specific performance limits. For ensured specifications and conditions, see the Electrical Characteristics. (2) If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications. (3) Refer to JEDEC J-STD-020C for surface mount device (SMD) package reflow profiles and conditions. Unless otherwise stated, the temperatures and times are for Sn-Pb (STD) only. (4) The human body model is a 100pF capacitor discharged through a 1.5k Ω resistor into each pin. Test method is per JESD22-A114. (5) Device operation must be evaluated, and derated as needed, based on ambient temperature (TA), power dissipation (PD), maximum allowable operating junction temperature (TJ(MAX)), and package thermal resistance (θJA). 2 Submit Documentation Feedback Copyright © 2007–2013, Texas Instruments Incorporated Product Folder Links: LP38512 |
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