LM48520, LM48520TLBD

SNAS367C – FEBRUARY 2008 – REVISED APRIL 2013

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Operating Ratings

Temperature Range

TMIN ≤ TA ≤ TMAX

−40°C ≤ TA ≤ +85°C

Supply Voltage (VDD)

2.7V

≤ VDD ≤ 5.0V

Amplifier Voltage (V1 )

Not under Boosted Condition

2.4V

≤ V1 ≤ 5.5V

Amplifier Voltage (PV1 )

Under Boosted Condition

3.0V

≤ PV1 ≤ 5.0V

Electrical Characteristics VDD = 3.3V

(1) (2)

The following specifications apply for VDD = 3.3V, AV = 6dB, RL = 15µH + 8Ω +15µH, fIN = 1kHz, unless otherwise specified.

Limits apply for TA = 25°C, R1 = 40.2kΩ, R2 = 16.2kΩ, V1 = PV1 = 5V, Vlimit = GND. All electrical specifications are for amplifier

and booster.

LM48520

Units

Parameter

Test Conditions

Typ

Limit

(Limits)

(3)

(4) (5)

VIN = 0, RLOAD = ∞

VDD = 2.7V

14.8

IDD

Quiescent Power Supply Current

VDD = 3.3V

11.5

15.5

mA (max)

VDD = 5.0V

8.0

ISD

Shutdown Current

VSHUTDOWN = GND

0.04

1.0

μA (max)

VSDIH

Shutdown Voltage Input High

For SD Boost, SD Amp

1.4

V

VSDIL

Shutdown Voltage Input Low

For SD Boost, SD Amp

0.4

V

TWU

Wake-up Time

Amplifier + Booster Wakeup

3

ms

VOS

Output Offset Voltage

5

mV

G0, G1 = GND

6

dB

RL = ∞

G0 = VDD, G1 = GND

12

dB

RL = ∞

AV

Gain

G0 = GND, G1 = VDD

18

dB

RL = ∞

G0, G1 = VDD

24

dB

RL = ∞

RL = 15μH + 8Ω + 15μH

THD+N = 1% (max),

1.1

0.87

W (min)

f = 1kHz, 22kHz, BW

VDD = 3.3V

PO

Output Power

RL = 15μH + 8Ω + 15μH

THD+N = 10% (max),

1.3

W

f = 1kHz, 22kHz, BW

VDD = 3.3V

PO = 500mW, f = 1kHz,

THD+N

Total Harmonic Distortion + Noise

RL = 15μH + 8Ω + 15μH,

0.04

%

VDD = 3.3V

VDD = 3.6V, f = 20Hz – 20kHz

εOS

Output Noise

32

µVRMS

Inputs to AC GND, A weighted

(1)

All voltages are measured with respect to the GND pin, unless otherwise specified.

(2)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is functional, but do not ensure specific performance limits. Electrical Characteristics state DC and AC electrical

specifications under particular test conditions which ensure specific performance limits. This assumes that the device is within the

Operating Ratings. Specifications are not ensured for parameters where no limit is given, however, the typical value is a good indication

of device performance.

(3)

Typicals are measured at 25°C and represent the parametric norm.

(4)

Limits are specified to AOQL (Average Outgoing Quality Level).

(5)

Datasheet min/max specification limits are ensured by design, test, or statistical analysis.

4

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