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SSM3K04FS датащи(PDF) 2 Page - Toshiba Semiconductor |
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SSM3K04FS датащи(HTML) 2 Page - Toshiba Semiconductor |
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2 / 5 page ![]() SSM3K04FS 2007-11-01 2 Electrical Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Min Typ. Max Unit Gate leakage current IGSS VGS = 10 V, VDS = 0 ⎯ ⎯ 15 μA Drain-source breakdown voltage V (BR) DSS ID = 100 μA, VGS = 0 20 ⎯ ⎯ V Drain cut-off current IDSS VDS = 20 V, VGS = 0 ⎯ ⎯ 1 μA Gate threshold voltage Vth VDS = 3 V, ID = 0.1 mA 0.7 ⎯ 1.3 V Forward transfer admittance ⎪Yfs⎪ VDS = 3 V, ID = 10 mA 25 50 ⎯ mS Drain-source ON resistance RDS (ON) ID = 10 mA, VGS = 2.5 V ⎯ 4 12 Ω Input capacitance Ciss VDS = 3 V, VGS = 0, f = 1 MHz ⎯ 11.0 ⎯ pF Reverse transfer capacitance Crss VDS = 3 V, VGS = 0, f = 1 MHz ⎯ 3.3 ⎯ pF Output capacitance Coss VDS = 3 V, VGS = 0, f = 1 MHz ⎯ 9.3 ⎯ pF Turn-on time ton VDD = 3 V, ID = 10 mA, VGS = 0~2.5 V ⎯ 0.16 ⎯ Switching time Turn-off time toff VDD = 3 V, ID = 10 mA, VGS = 0~2.5 V ⎯ 0.19 ⎯ μs Gate-source resistor RGS VGS = 0~10 V 0.7 1.0 1.3 M Ω Switching Time Test Circuit (a) Test circuit (b) VIN VGS (c) VOUT VDS |
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