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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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74ALVC541 датащи(PDF) 9 Page - NXP Semiconductors |
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74ALVC541 датащи(HTML) 9 Page - NXP Semiconductors |
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9 / 15 page  74ALVC541_2 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 02 — 5 November 2007 9 of 15 NXP Semiconductors 74ALVC541 Octal buffer/line driver; 3-state Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator CL = Load capacitance including jig and probe capacitance RL = Load resistor Fig 7. Load circuitry for switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aae331 VEXT VCC VI VO DUT CL RT RL RL G Table 9. Test data Supply voltage Input Load VEXT VCC VI tr, tf CL RL tPLH, tPHL tPLZ, tPZL tPHZ, tPZH 1.65 V to 1.95 V VCC ≤ 2.0 ns 30 pF 1 k Ω open 2 × VCC GND 2.3 V to 2.7 V VCC ≤ 2.0 ns 30 pF 500 Ω open 2 × VCC GND 2.7 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 6 GND 3.0 V to 3.6 V 2.7 V ≤ 2.5 ns 50 pF 500 Ω open 6 GND |
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