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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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93AA76-/P датащи(PDF) 4 Page - Microchip Technology |
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93AA76-/P датащи(HTML) 4 Page - Microchip Technology |
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4 / 22 page  93AA76/86 DS21130E-page 4 2004 Microchip Technology Inc. TABLE 1-2: AC CHARACTERISTICS AC CHARACTERISTICS Applicable over recommended operating ranges shown below unless otherwise noted: VCC = +1.8V to +6.0V Commercial (C): TA = 0°C to +70°C Parameter Symbol Min. Max. Units Conditions Clock frequency FCLK —3 2 1 MHz MHz Mhz 4.5V ≤ VCC ≤ 6.0V 2.5V ≤ VCC ≤ 4.5V 1.8V ≤ VCC < 2.5V Clock high time TCKH 200 300 500 —ns ns ns 4.5V ≥ VCC ≤ 6.0V 2.5V ≤ VCC < 4.5V 1.8V ≤ VCC < 2.5V Clock low time TCKL 100 200 500 —ns ns ns 4.5V ≤ VCC ≤ 6.0V 2.5V ≤ VCC < 4.5V 1.8V ≤ VCC < 2.5V Chip select setup time TCSS 50 100 250 —ns ns ns 4.5V ≤ VCC ≤ 6.0V, Relative to CLK 2.5V ≤ VCC < 4.5V, Relative to CLK 1.8V ≤ VCC < 2.5V, Relative to CLK Chip select hold time TCSH 0 — ns 1.8V ≤ VCC ≤ 6.0V Chip select low time TCSL 250 — ns 1.8V ≤ VCC ≤ 6.0V, Relative to CLK Data input setup time TDIS 50 100 250 —ns ns ns 4.5V ≤ VCC ≤ 6.0V, Relative to CLK 2.5V ≤ VCC <4.5V, Relative to CLK 1.8V ≤ VCC < 2.5V, Relative to CLK Data input hold time TDIH 50 100 250 —ns ns ns 4.5V ≤ VCC ≤ 6.0V, Relative to CLK 2.5V ≤ VCC < 4.5V, Relative to CLK 1.8V ≤ VCC < 2.5V, Relative to CLK Data output delay time TPD —100 250 500 ns ns ns 4.5V ≤ VCC ≤ 6.0V, CL = 100 pF 2.5V ≤ VCC < 4.5V, CL = 100 pF 1.8V ≤ VCC < 2.5V, CL = 100 pF Data output disable time TCZ —100 500 ns ns 4.5V ≤ VCC ≤ 5.5V (Note 1) 1.8V ≤ VCC < 4.5V (Note 1) Status valid time Tsv — 200 300 500 ns ns ns 4.5V ≥ VCC ≤ 6.0V, CL = 100 pF 2.5V ≤ VCC < 4.5V, CL = 100 pF 1.8V ≤ VCC < 2.5V, CL = 100 pF Program cycle time TWC — 5 ms Erase/Write mode TEC —15 ms ERAL mode TWL — 30 ms WRAL mode Endurance — 1M — cycles 25°C, VCC = 5.0V, Block mode (Note 2) Note 1: This parameter is periodically sampled and not 100% tested. 2: This parameter is not tested but ensured by characterization. For endurance estimates in a specific application, please consult the Total Endurance™ Model which can be obtained from Microchip’s web site at: www.microchip.com |
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