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LTC3522 датащи(PDF) 3 Page - Linear Technology |
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LTC3522 датащи(HTML) 3 Page - Linear Technology |
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3 / 20 page ![]() LTC3522 3 3522f Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: The LTC3522 is guaranteed to meet performance specifications from 0°C to 85°C. Specifications over the –40°C to 85°C operating temperature range are assured by design, characterization and correlation with statistical process controls. Note 3: Current measurements are performed when the LTC3522 is not switching. The current limit values in operation will be somewhat higher due to the propagation delay of the comparators. PARAMETER CONDITIONS MIN TYP MAX UNITS PGOOD Threshold VFB2 Falling –11.3 –7.7 –4.1 % Power Good Hysteresis 2.5 % Buck-Boost Converter Output Voltage ● 2.2 5.25 V PMOS Switch Resistance 0.29 Ω NMOS Switch Resistance 0.22 Ω NMOS Switch Leakage VSW1A = VSW1B = 5V, PVIN1 = PVIN2 = 5V 0.1 5 μA PMOS Switch Leakage VSW1A = VSW1B = 0V, PVIN1 = PVIN2 = 5V 0.1 10 μA Feedback Voltage (Note 4) ● 0.97 1 1.03 V Feedback Input Current 150 nA Average Current Limit (Note 3) 0.65 0.85 A Burst Mode Current Limit 230 340 mA Reverse Current Limit (Note 3) 250 mA Maximum Duty Cycle VFB1 = 0.9V ● 70 80 % Minimum Duty Cycle VFB1 = 1.1V ● 0% PGOOD Threshold VFB1 Falling –12 –10 –8 % Power Good Hysteresis 2.5 % ELECTRICAL CHARACTERISTICS The ● denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. PVIN1 = PVIN2 = 3.6V, VOUT1 = 3.3V unless otherwise noted. Note 4: The LTC3522 is tested in a proprietary non-switching test mode that connects each FB pin to the output of the respective error amplifier. Note 5: This IC includes overtemperature protection that is intended to protect the device during momentary overload conditions. Junction temperature will exceed 125°C when overtemperature protection is active. Continuous operation above the specified maximum operating junction temperature may impair device reliability. |
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