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PLS153 датащи(PDF) 5 Page - NXP Semiconductors |
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PLS153 датащи(HTML) 5 Page - NXP Semiconductors |
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5 / 9 page ![]() Philips Semiconductors Programmable Logic Devices Product specification PLS153/A Programmable logic arrays (18 × 42 × 10) October 22, 1993 5 AC ELECTRICAL CHARACTERISTICS 0 °C ≤ Tamb ≤ +75°C, 4.75V ≤ VCC ≤ 5.25V, R1 = 300Ω, R2 = 390Ω LIMITS SYMBOL PARAMETER FROM TO TEST PLS153 PLS153A UNIT CONDITION MIN TYP1 MAX MIN TYP1 MAX tPD Propagation delay Input ± Output ± CL = 30pF 30 40 20 30 ns tOE Output enable2 Input ± Output – CL = 30pF 25 35 20 30 ns tOD Output disable2 Input ± Output + CL = 5pF 25 35 20 30 ns NOTES: 1. All typical values are at VCC = 5V, Tamb = +25°C. 2. For 3-State output; output enable times are tested with CL = 30pF to the 1.5V level, and S1 is open for high-impedance to High tests and closed for high-impedance to Low tests. Output disable times are tested with CL = 5pF. High-to-High impedance tests are made to an output voltage of VT = (VOH – 0.5V) with S1 open, and Low-to-High impedance tests are made to the VT = (VOL + 0.5V) level with S1 closed. 3. All propagation delays are measured and specified under worst case conditions. VOLTAGE WAVEFORMS 90% 10% 5ns 5ns 5ns 5ns 90% 10% +3.0V +3.0V 0V 0V tR tF MEASUREMENTS: All circuit delays are measured at the +1.5V level of inputs and outputs, unless otherwise specified. Input Pulses SP00017 TIMING DEFINITIONS SYMBOL PARAMETER tPD Propagation delay between input and output. tOD Delay between input change and when output is off (Hi-Z or High). tOE Delay between input change and when output reflects specified output level. TEST LOAD CIRCUIT +5V CL R1 R2 S1 GND BZ BY INPUTS I0 I7 BW BX OUTPUTS C2 C1 DUT NOTE: C1 and C2 are to bypass VCC to GND. VCC SP00278 |
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