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PLS153 датащи(PDF) 5 Page - NXP Semiconductors

номер детали PLS153
подробное описание детали  Programmable logic arrays 18 횞 42 횞 10
PDF  9 Pages
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производитель  PHILIPS [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

PLS153 датащи(HTML) 5 Page - NXP Semiconductors

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Philips Semiconductors Programmable Logic Devices
Product specification
PLS153/A
Programmable logic arrays
(18
× 42 × 10)
October 22, 1993
5
AC ELECTRICAL CHARACTERISTICS
0
°C ≤ Tamb ≤ +75°C, 4.75V ≤ VCC ≤ 5.25V, R1 = 300Ω, R2 = 390Ω
LIMITS
SYMBOL
PARAMETER
FROM
TO
TEST
PLS153
PLS153A
UNIT
CONDITION
MIN
TYP1
MAX
MIN
TYP1
MAX
tPD
Propagation delay
Input
±
Output
±
CL = 30pF
30
40
20
30
ns
tOE
Output enable2
Input
±
Output –
CL = 30pF
25
35
20
30
ns
tOD
Output disable2
Input
±
Output +
CL = 5pF
25
35
20
30
ns
NOTES:
1. All typical values are at VCC = 5V, Tamb = +25°C.
2. For 3-State output; output enable times are tested with CL = 30pF to the 1.5V level, and S1 is open for high-impedance to High tests and
closed for high-impedance to Low tests. Output disable times are tested with CL = 5pF. High-to-High impedance tests are made to an output
voltage of VT = (VOH – 0.5V) with S1 open, and Low-to-High impedance tests are made to the VT = (VOL + 0.5V) level with S1 closed.
3. All propagation delays are measured and specified under worst case conditions.
VOLTAGE WAVEFORMS
90%
10%
5ns
5ns
5ns
5ns
90%
10%
+3.0V
+3.0V
0V
0V
tR
tF
MEASUREMENTS:
All circuit delays are measured at the +1.5V level of
inputs and outputs, unless otherwise specified.
Input Pulses
SP00017
TIMING DEFINITIONS
SYMBOL
PARAMETER
tPD
Propagation delay between
input and output.
tOD
Delay between input change
and when output is off (Hi-Z
or High).
tOE
Delay between input change
and when output reflects
specified output level.
TEST LOAD CIRCUIT
+5V
CL
R1
R2
S1
GND
BZ
BY
INPUTS
I0
I7
BW
BX
OUTPUTS
C2
C1
DUT
NOTE:
C1 and C2 are to bypass VCC to GND.
VCC
SP00278



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