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PCK2020 датащи(PDF) 11 Page - NXP Semiconductors

номер детали PCK2020
подробное описание детали  CK00 100/133MHz spread spectrum differential system clock generator
PDF  16 Pages
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производитель  PHILIPS [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

PCK2020 датащи(HTML) 11 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
PCK2020
CK00 (100/133MHz) spread spectrum
differential system clock generator
2000 Nov 13
11
GROUP OFFSET LIMITS
GROUP
OFFSET
MEASUREMENT LOADS (LUMPED)
MEASURE POINTS
NOTES
3V66 to PCI
1.5–3.5 ns
3V66 leads
3V66 @ 30 pf
PCI @ 30 pf
3V66 @ 1.5 V
PCI @ 1.5 V
19, 20
NOTES:
1. Output drivers must have monotonic rise/fall times through the specified VOL/VOH levels.
2. Period, jitter, offset and skew measured on rising edge @ 1.25 V for 2.5 V clocks and @ 1.5 V for 3.3 V clocks.
3. The PCI clock is the Host clock divided by four at Host = 133 MHz. PCI clock is the Host clock divided by three at Host = 100 MHz.
4. 3V66 is internal VCO frequency divided by four for Host = 133 MHz. 3V66 clock is internal VCO frequency divided by three at Host =
100 MHz.
5. THKH is measured at 2.0 V for 2.5 V outputs and 2.4 V for 3.3 V outputs as shown in Figure 7.
6. THKL is measured at 0.4 V for all outputs as shown in Figure 7.
7. The time is specified from when VDDQ achieves its normal operating level (typical condition VDDQ = 3.3 V) until the frequency output is stable
and operating within specification.
8. THRISE and THFALL are measured as a transition through the threshold region VOL = 0.4 V and VOH = 2.4 V (1 mA) JEDEC specification.
9. The average period over any 1
µs period of time must be greater than the minimum specified period.
10. Calculated at minimum edge-rate (1 V/ns) to guarantee 45/55% duty-cycle. Pulse width is required to be wider at faster edge-rate to ensure
duty-cycle specification is met.
11. Test load is Rs = 33.2
Ω, Rp = 49.9 Ω.
12. Must be guaranteed in a realistic system environment.
13. Configured for VOH = 0.71 V in a 50 Ω environment.
14. Measured at crossing points.
15. Measured at 20% to 80%.
16. Determined as a fraction of 2* (Trp–Trn)/(Trp+Trn) where Trp is a rising edge and Trn is an intersecting falling edge.
17. Voltage measure point (Vm = 1.25 V). VDD = 2.5 V.
18. Voltage measure point (Vm = 1.5 V). VDD = 3.3 V.
19. All offsets are to be measured at rising edges.
20. Parameters are guaranteed by design.



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