KRTB AELPS1.32

DATASHEET

DATASHEET

32 | Version 1.3 | 2022-09-21

Glossary

1)

Brightness: Brightness values are measured during a current pulse of typically 25 ms, with an internal

reproducibility of ±8 % and an expanded uncertainty of ±11 % (acc. to GUM with a coverage factor of

k = 3).

2)

Reverse Operation: This product is intended to be operated applying a forward current within the

specified range. Applying any continuous reverse bias or forward bias below the voltage range of light

emission shall be avoided because it may cause migration which can change the electro-optical char-

acteristics or damage the LED.

3)

Wavelength: The wavelength is measured at a current pulse of typically 25 ms, with an internal repro-

ducibility of ±0.5 nm and an expanded uncertainty of ±1 nm (acc. to GUM with a coverage factor of k =

3).

4)

Forward Voltage: Forward voltages are tested at a current pulse duration of 1 ms and a tolerance of

±0.05 V and an expanded uncertainty of ±0.1 V (acc. to GUM with a coverage factor of k = 3).

5)

Thermal Resistance: Rth max is based on statistic values (6σ).

6)

Typical Values: Due to the special conditions of the manufacturing processes of semiconductor devic-

es, the typical data or calculated correlations of technical parameters can only reflect statistical figures.

These do not necessarily correspond to the actual parameters of each single product, which could dif-

fer from the typical data and calculated correlations or the typical characteristic line. If requested, e.g.

because of technical improvements, these typ. data will be changed without any further notice.

7)

Tolerance of Measure: Unless otherwise noted in drawing, tolerances are specified with ±0.1 and

dimensions are specified in mm.

8)

Tape and Reel: All dimensions and tolerances are specified acc. IEC 60286-3 and specified in mm.