SRAM

SRAM

SRAM

SRAM

SRAM

AS8S128K32

Austin Semiconductor, Inc.

AS8S128K32

Rev. 4.0 5/03

Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.

3

AC TEST CONDITIONS

TEST SPECIFICATIONS

Input pulse levels........................................VSS to 3V

Input rise and fall times..........................................5ns

Input timing reference levels.................................1.5V

Output reference levels........................................1.5V

Output load.............................................See Figures 1

TRUTH TABLE

MODE

OE\

CE\

WE\

I/O

POWER

Read

L

L

H

Q

ACTIVE

Write

X

L

L

D

ACTIVE

Standby

X

H

X

HIGH Z

STANDBY

Not Selected

H

L

H

HIGH Z

ACTIVE

OH

OL

I

I

Current Source

Current Source

Vz = 1.5V

(Bipolar

Supply)

Device

Under

Test

Ceff = 50pf

-+

+

NOTES:

Vz is programable from -2V to + 7V.

I

Vz is typically the midpoint of V

I

circuit.

SYMBOL

PARAMETER

MAX

UNITS

NOTES

A0 - A18 Capacitance

40

pF

4

OE\ Capacitance

40

pF

4

WE\ and CE\ Capacitance

20

pF

4

I/O 0- I/O 31 Capacitance

20

pF

4

Figure 1

CAPACITANCE TABLE (V