 |
поискавой системы для электроныых деталей |
|
|
поискавой системы для электроныых деталей |
|
DM54LS73AJ датащи(PDF) 3 Page - National Semiconductor (TI) |
|
|
|
|||||||||||||||||||||||||||||
DM54LS73AJ датащи(HTML) 3 Page - National Semiconductor (TI) |
|
|
3 / 6 page  Electrical Characteristics over recommended operating free air temperature range (unless otherwise noted) Symbol Parameter Conditions Min Typ Max Units (Note 1) VI Input Clamp Voltage VCC e Min II eb18 mA b 15 V VOH High Level Output VCC e Min IOH e Max DM54 25 34 V Voltage VIL e Max VIH e Min DM74 27 34 VOL Low Level Output VCC e Min IOL e Max DM54 025 04 Voltage VIL e Max VIH e Min DM74 035 05 V IOL e 4 mA VCC e Min DM74 025 04 II Input Current Max VCC e Max J K 01 Input Voltage VI e 7V Clear 03 mA Clock 04 IIH High Level Input VCC e Max J K 20 Current VI e 27V Clear 60 m A Clock 80 IIL Low Level Input VCC e Max J K b 04 Current VI e 04V Clear b 08 mA Clock b 08 IOS Short Circuit VCC e Max DM54 b 20 b 100 mA Output Current (Note 2) DM74 b 20 b 100 ICC Supply Current VCC e Max (Note 3) 4 6 mA Switching Characteristics at VCC e 5V and TA e 25 C (See Section 1 for Test Waveforms and Output Load) From (Input) RL e 2kX Symbol Parameter To (Output) CL e 15 pF CL e 50 pF Units Min Max Min Max fMAX Maximum Clock 30 25 MHz Frequency tPHL Propagation Delay Time Clear 20 28 ns High to Low Level Output to Q tPLH Propagation Delay Time Clear 20 24 ns Low to High Level Output to Q tPLH Propagation Delay Time Clock to 20 24 ns Low to High Level Output Q or Q tPHL Propagation Delay Time Clock to 20 28 ns High to Low Level Output Q or Q Note 1 All typicals are at VCC e 5V TA e 25 C Note 2 Not more than one output should be shorted at a time and the duration should not exceed one second For devices with feedback from the outputs where shorting the outputs to ground may cause the outputs to change logic state an equivalent test may be performed where VO e 225V and 2125V for DM54 and DM74 series respectively with the minimum and maximum limits reduced by one half from their stated values This is very useful when using automatic test equipment Note 3 With all outputs open ICC is measured with the Q and Q outputs high in turn At the time of measurement the clock is grounded 3 |
|
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Russian ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
