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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AM29F160D датащи(PDF) 33 Page - SPANSION |
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AM29F160D датащи(HTML) 33 Page - SPANSION |
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33 / 47 page  November 2, 2006 Am29F160D_00_D6 Am29F160D 31 D A TA SH EE T AC CHARACTERISTICS Read Operations Notes: 1. Not 100% tested. 2. See Figure 9, on page 30 and Table 11 on page 30 for test specifications. Parameter Description Speed Option JEDEC Std. Test Setup 70, 75 90 Unit tAVAV tRC Read Cycle Time (Note 1) Min 70 90 ns tAVQV tACC Address to Output Delay CE# = VIL OE# = VIL Max 70 90 ns tELQV tCE Chip Enable to Output Delay OE# = VIL Max 70 90 ns tGLQV tOE Output Enable to Output Delay Max 30 35 ns tEHQZ tDF Chip Enable to Output High Z (Note 1) Max 20 20 ns tGHQZ tDF Output Enable to Output High Z (Note 1) Max 20 20 ns tOEH Output Enable Hold Time (Note 1) Read Min 0 ns Toggle and Data# Polling Min 10 ns tAXQX tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First (Note 1) Min 0 ns tCE Outputs WE# Addresses CE# OE# HIGH Z Output Valid HIGH Z Addresses Stable tRC tACC tOEH tOE 0 V RY/BY# RESET# tDF tOH Figure 10. Read Operations Timings |
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