5

FN2473.3

September 12, 2005

Specifications HCS138MS

Output Voltage Low

VOL

VCC = 4.5V and 5.5V, VIH = 0.70(VCC),

VIL = 0.30(VCC), IOL = 50

µA

0.1

V

Output Voltage High

VOH

VCC = 4.5V and 5.5V, VIH = 0.70(VCC),

VIL = 0.30(VCC), IOH = -50

µA

-0.1

-V

Input Leakage Current

IIN

VCC = 5.5V, VIN = VCC or GND

±5

µA

Noise Immunity

Functional Test

FN

VCC = 4.5V, VIH = 0.70(VCC),

VIL = 0.30(VCC), (Note 3)

---

Address to Output

TPLH

VCC = 4.5V

2

34

ns

TPHL

VCC = 4.5V

2

34

ns

Enable to Output

TPLH

VCC = 4.5V

2

33

ns

TPHL

VCC = 4.5V

2

33

ns

NOTES:

1. All voltages referenced to device GND.

2. AC measurements assume RL = 500

Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.

3. For functional tests VO

≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.

PARAMETER

GROUP B

SUBGROUP

DELTA LIMIT

ICC

5

12

µA

IOL/IOH

5

-15% of 0 Hour

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUPS

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Initial Test (Preburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

Interim Test I (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

Interim Test II (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

PDA

100%/5004

1, 7, 9, Deltas

Interim Test III (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

PDA

100%/5004

1, 7, 9, Deltas

Final Test

100%/5004

2, 3, 8A, 8B, 10, 11

Group A (Note 1)

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample/5005

1, 7, 9

Group D

Sample/5005

1, 7, 9

NOTE:

1. Alternate group A inspection in accordance with method 5005 of MIL-STD-883 may be exercised.

TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)

PARAMETER

SYMBOL

(NOTES 1, 2)

CONDITIONS

TEMPERATURE

200K RAD

LIMITS

UNITS

MIN

MAX