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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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SY100S321 датащи(PDF) 4 Page - Micrel Semiconductor |
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SY100S321 датащи(HTML) 4 Page - Micrel Semiconductor |
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4 / 6 page  4 SY100S321 Micrel, Inc. M9999-032206 hbwhelp@micrel.com or (408) 955-1690 PULSE GENERATOR SCOPE CHAN B CIRCUIT UNDER TEST SCOPE CHAN A RT RT L1 L2 VCC 0.1 µF VEE 0.1 µF Figure 1. AC Test Circuit TEST CIRCUITRY(1) Figure 2. Propagation Delay and Transition Times SWITCHING WAVEFORMS Note: 1. VCC, VCCA = +2V, VEE = –2.5V. L1 and L2 = equal length 50 Ω impedance lines. RT = 50 Ω terminator internal to scope. Decoupling 0.1 µF from GND to VCC and VEE. All unused outputs are loaded with 50 Ω to GND. CL = Fixture and stray capacitance ≤ 3pF. INPUT tPLH tPHL tTLH tTHL OUTPUT 20% 50% 80% 20% 50% 80% 0.7 ± 0.1ns 0.7 ± 0.1ns –0.95V –1.69V Note: VEE = –4.2V to –5.5V unless otherwise specified, VCC = VCCA = GND |
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