Discontinued

Parts

2

CAT25C33/65

Doc. No. 1000, Rev. H

© 2005 by Catalyst Semiconductor, Inc.

Characteristics subject to change without notice

D.C. OPERATING CHARACTERISTICS

Limits

Symbol

Parameter

Min.

Typ.

Max.

Units

Test Conditions

Power Supply Current

10

mA

(Operating Write)

SO=open; CS=Vss

Power Supply Current

2

mA

(Operating Read)

Power Supply Current

1

µA

(Standby)

Input Leakage Current

2

µA

Output Leakage Current

3

CS = 0V

Input Low Voltage

-1

V

Input High Voltage

V

Output Low Voltage

0.4

V

Output High Voltage

V

Output Low Voltage

0.2

V

1.8V

Output High Voltage

V

µA

µA

ABSOLUTE MAXIMUM RATINGS*

Temperature Under Bias ................. –55

°C to +125°C

Storage Temperature ....................... –65

°C to +150°C

Voltage on any Pin with

Package Power Dissipation

Capability (Ta = 25

°C)................................... 1.0W

Lead Soldering Temperature (10 secs) ............ 300

°C

*COMMENT

Stresses above those listed under “Absolute Maximum

Ratings” may cause permanent damage to the device.

These are stress ratings only, and functional operation

of the device at these or any other conditions outside of

those listed in the operational sections of this specifica-

tion is not implied. Exposure to any absolute maximum

rating for extended periods may affect device perfor-

mance and reliability.

Note:

(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC

(2) Output shorted for no more than one second. No more than one output shorted at a time.

(3) These parameter are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100

and JEDEC test methods.

4.5V

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Min.

Typ.

Max.

Units

Endurance

1,000,000

Cycles/Byte

Data Retention

100

Years

ESD Susceptibility

2000

Volts

Latch-up

100

mA