| поискавой системы для электроныых деталей |
|
CS5165 датащи(PDF) 16 Page - ON Semiconductor |
|
|
|||||||||||||||||||||||||||||
CS5165 датащи(HTML) 16 Page - ON Semiconductor |
|
16 / 21 page ![]() CS5165 http://onsemi.com 16 It is therefore required that the output voltage attains an out of regulation or in regulation level for at least the built−in delay time duration before the Power Good signal can change state. Figure 25. Power Good is Insensitive to Out of Regulation Conditions that are Present for a Duration Less Than the Built In Delay Trace 4− VFB (1.0 V/div.) Trace 2− PWRGD (2.0 V/div.) Selecting External Components The CS5165 buck regulator can be used with a wide range of external power components to optimize the cost and performance of a particular design. The following information can be used as general guidelines to assist in their selection. NFET Power Transistors Both logic level and standard FETs can be used. The reference designs derive gate drive from the 12 V supply which is generally available in most computer systems and utilize logic level FETs. A charge pump may be easily implemented to support 5.0 V only systems. Multiple FET’s may be paralleled to reduce losses and improve efficiency and thermal management. Voltage applied to the FET gates depends on the application circuit used. Both upper and lower gate driver outputs are specified to drive to within 1.5 V of ground when in the low state and to within 2.0 V of their respective bias supplies when in the high state. In practice, the FET gates will be driven rail to rail due to overshoot caused by the capacitive load they present to the controller IC. For the typical application where VCC = 12 V and 5.0 V is used as the source for the regulator output current, the following gate drive is provided: VGS(BOTTOM) + 12 V VGS(TOP) + 12 V * 5.0 V + 7.0 V (see Figure 26) Figure 26. Gate Drive Waveforms Depicting Rail to Rail Swing Trace 3− GATE(H) (10 V/div.) Trace 1− GATE(H) − 5.0 VIN Trace 4− GATE(L) (10 V/div.) Trace 2− Inductor Switching Node (5.0 V/div.) Figure 27. Normal Operation Showing the Guaranteed Non−Overlap Time Between the High and Low−Side MOSFET Gate Drives, ILOAD = 14 A Trace 1 = GATE(H) (5.0 V/div.) Trace 2 = GATE(L) (5.0 V/div.) @ 2.2 V The CS5165 provides adaptive control of the external NFET conduction times by guaranteeing a typical 65 ns non−overlap between the upper and lower MOSFET gate drive pulses. This feature eliminates the potentially catastrophic effect of “shoot−through current”, a condition during which both FETs conduct causing them to overheat, self−destruct, and possibly inflict irreversible damage to the processor. The most important aspect of FET performance is RDSON, which effects regulator efficiency and FET thermal management requirements. The power dissipated by the MOSFETs may be estimated as follows: Switching MOSFET: |
|
|
ссылки URL |
| Вашему бизинису помогли Аллдатащит? [ DONATE ] |
Что такое Аллдатащит | реклама | контакт | Конфиденциальность | Ссылка на техническое описание | обмен ссыками | поиск по производителю All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |