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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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ST72F324J2T3 датащи(PDF) 131 Page - STMicroelectronics |
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ST72F324J2T3 датащи(HTML) 131 Page - STMicroelectronics |
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131 / 163 page  ST72324 131/163 EMC CHARACTERISTICS (Cont’d) 12.8.2 Electro Magnetic Interference (EMI) Based on a simple application running on the product (toggling 2 LEDs through the I/O ports), the product is monitored in terms of emission. This emission test is in line with the norm SAE J 1752/ 3 which specifies the board and the loading of each pin. Notes: 1. Data based on characterization results, not tested in production. 2. Refer to Application Note AN1709 for data on other package types. Symbol Parameter Conditions Device/ Package Monitored Frequency Band Max vs. [fOSC/fCPU] Unit 8/4MHz 16/8MHz SEMI Peak level VDD=5V, TA=+25°C conforming to SAE J 1752/3 8/16K Flash/ TQFP44 0.1MHz to 30MHz 12 18 dB µV 30MHz to 130MHz 19 25 130MHz to 1GHz 15 22 SAE EMI Level 3 3.5 - 32K Flash/TQFP44 0.1MHz to 30MHz 20 21 dB µV 30MHz to 130MHz 26 31 130MHz to 1GHz 22 28 SAE EMI Level 3.5 4.0 - Flash/TQFP32 0.1MHz to 30MHz 25 27 dB µV 30MHz to 130MHz 30 36 130MHz to 1GHz 18 23 SAE EMI Level 3.0 3.5 - 1 |
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