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RT5133AWSC датащи(PDF) 10 Page - Richtek Technology Corporation |
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RT5133AWSC датащи(HTML) 10 Page - Richtek Technology Corporation |
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10 / 41 page ![]() RT5133A Copyright © 2022 Richtek Technology Corporation. All rights reserved. is a registered trademark of Richtek Technology Corporation. www.richtek.com DS5133A-00 March 2022 10 Parameter Symbol Test Condition Min Typ Max Unit Quiescent Current IIQ_LDO1/2 VDDA = PVIN > VOUT + Dropout ILOAD = 0mA and not include base Iq. -- 30 45 A IIQ_LDO3/4/5/6 VDDA = PVIN > VOUT + Dropout ILOAD = 0mA and not include base Iq. -- 55 65 IIQ_LDO7/8 PVIN > VOUT + Dropout ILOAD = 0mA, LDO7 & LDO8 are turned on -- 220 320 Output Noise Voltage (Note 5) Noise_LDO1/2 VOUT = 1.8V/150mA -- 45 -- Vrms Noise_LDO3/4/5/6 VOUT = 2.8V/150mA -- 50 -- Noise_LDO7/8 VOUT = 1.1V/300mA -- 75 -- I2C characteristics SCL, SDA High- Level Input Threshold Voltage VIH_I2C VDD = 1.8V to 5V 1.2 -- -- V SCL, SDA Low-Level Input Threshold Voltage VIL_I2C VDD = 1.8V to 5V -- -- 0.4 V SCL Clock Frequency fCLK Fast-mode -- -- 400 kHz High-speed mode Cb = 100pF -- -- 3.4 MHz Bus Free Time between Stop and Start Condition tBUF Fast-mode 1.3 -- -- s (Repeated) Start Hold Time tHD;STA Fast-mode 0.6 -- -- s High-speed mode Cb = 100pF 160 -- -- ns (Repeated) Start Setup Time tSU;STA Fast-mode 0.6 -- -- s High-speed mode Cb = 100 pF 160 -- -- ns STOP Condition Setup Time tSU;STO Fast-mode 0.6 -- -- s High-speed mode Cb = 100pF 160 -- -- ns SDA Data Hold Time tHD;DAT Fast-mode 0 -- -- ns High-speed mode Cb = 100pF 0 -- 70 SDA Valid Acknowledge Time tVD;ACK Fast-mode -- -- 0.9 s SDA Setup Time tSU;DAT Fast-mode 100 -- -- ns High-speed mode Cb = 100pF 10 -- -- SCL Clock Low Time tLOW Fast-mode 1.3 -- -- s High-speed mode Cb = 100pF 160 -- -- ns SCL Clock High Time tHIGH Fast-mode 0.6 -- -- s High-speed mode Cb = 100pF 60 -- -- ns Note 1. Stresses beyond those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other condition beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect device reliability. Note 2. JA is measured under natural convection (still air) at TA = 25°C with the component mounted on a high effective-thermal- conductivity four-layer test board on a JEDEC 51-7 thermal measurement standard. |
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