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8/19

Rev.0.0

Dual-ChannelIsolatedGateDriver

BTD21520x

(Continued)

SwitchingParameters

tPLH Propagation delay from INx to OUTx rising edges

-

-

40

-

ns

tPHL Propagation delay from INx to OUTx falling edges

-

-

45

-

tr Output rise time

CL=1nF, 20% to 80%

-

10 26

ns

tf Output fall time

CL=1nF, 90% to 10%

-

10 26

tPWD Pulse width distortion (tPHL-tPLH)

-

-

-

5

tDM Propagation delays matching between VOUT1, VOUT2 f=100kHz, IN1=IN2

-

-

5

DT Dead time

DT pull up to VCC

Two output channels are

completely independent -

DT pin open

(not recommended)

-

8

15 ns

RDT=20kΩ

160 200 240

- Undervoltage lockout recovery time tVCC+ to OUT

-

-

40

-

us

tVDD+ to OUT

-

-

50

-

CMTI Common-mode transient immunity

INx fixed to GND or VCC,

VCM=1500V

100

-

- kV/us

(1) CL：Load capacitance from output pin OUT to VEE.

7.7WIDE-BODYPACKAGE(SOW-16)SAFETYPARAMETERS

Symbol

PARAMETER

TESTCONDITIONS

MIN TYP MAX UNIT

CLR External clearance

Shortest pin-to-pin distance through air

8.5

-

-

mm

CPG External creepage

Shortest pin-to-pin distance across the

package surface

8.5

-

-

DTI Distance through insulation

Minimum internal gap (internal clearance) of the

double insulation (2×10.5 µm)

17

-

- um

CTI Comparative tracking index

DIN EN 60112

600

-

-

V

- Overvoltage category

Voltage rating ＜600Vrms

I-III

-

-

-

Voltage rating ＜1000Vrms

I-II

-

-

VIORM Maximum repetitive peak

isolation voltage

AC voltage (bipolar)

2121 -

-

VPK

VIOWM Maximum working isolation voltage AC voltage (sine wave); time dependent

dielectric breakdown

1500 -

- Vrms

VIOTM Maximum transient

isolation voltage

100% VIOTM, 60s, 120% VIOTM, 1s

7000 -

-

VPK

VIOSM Maximum surge isolation voltage IEC 62368-1, 1.2/50us waveform, 1.6 x VIOSM

8000 -

-

Qpd Apparent charge

Method a, After Input/Output safety test

subgroup 2/3.VIN= VIOTM, 60s, Vpd=1.2 VIOTM, 10s

-

-

5

pC

Method a, After environmental tests subgroup 1.

VIN=VIOTM, 60s, Vpd=1.6VIOTM, 10s

-

-

5

Method b1; At routine test (100% production)

and preconditioning (type test)

VIN=1.2VIOTM, 1s, Vpd=1.875VIOTM, 1s

-

-

5

CIO Barrier capacitance, input to output VIO=0.4Vpeak, f=1MHz, sine wave

-

1.2

-

pF

RIO Isolation resistance, input to output

Test voltage of 500V, TA=25℃

1012

-

-

Ω

Test voltage of 500V, 100℃＜TA＜125℃

1011

-

-

Test voltage of 500V, TA=150℃

109

-

-

VISO

Pollution degree

-

-

2

-

-

Withstand isolation voltage

VTEST=VISO=5000Vrms, t=60 sec(qualification),

VTEST=1.2×VISO=6000Vrms,

t=1 sec(100% production)

5000 -

- Vrms