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115G датащи(PDF) 3 Page - ATTEND Technology Inc.

номер детали 115G
подробное описание детали  This specification covers the requirements for product performance, test methods and quality assurance provisions of 115G-AAAA-R
PDF  5 Pages
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производитель  ATTEND [ATTEND Technology Inc.]
домашняя страница  https://www.attend.com.tw/index.php
Logo ATTEND - ATTEND Technology Inc.

115G датащи(HTML) 3 Page - ATTEND Technology Inc.

  115G Datasheet HTML 1Page - ATTEND Technology Inc. 115G Datasheet HTML 2Page - ATTEND Technology Inc. 115G Datasheet HTML 3Page - ATTEND Technology Inc. 115G Datasheet HTML 4Page - ATTEND Technology Inc. 115G Datasheet HTML 5Page - ATTEND Technology Inc.  
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The information contained herein is exclusive property of. Do not copy and print except that Attend accepts.
本文件係屬立威科技股份有限公司所有;非經同意,不得以任何覆寫、拷貝、翻印等方式私自據有。亦不得擅加毀損、塗改。
-3 -
Durability
1).Shall meet visual requirement,
show no physical damage.
2).Shall meet requirements of
additional tests as specified in TEST
SEQUENCE in Section 5
Insertion and extraction are
repeated 5000 cycles with the
actually card at the speed rate of
400 ~ 600 cycles/hour.
Exchange the actually card every
2000 cycles.
(EIA 364-09)
Contact Retention Force
0.3±0.15Kgf
Shall be measured with TENSION
GAUGE or TENSION TESTER in same
direction
(EIA 364-35)
ENVIRONMENTAL
Item
Requirement
Test Condition
Thermal Shock
1).No evidence of damage
2).The electrical performances should
meet the spec. Specified.
Subject mated connectors should be
tested according to the condition
listed below:
Temperature:-55 to +85°C
Cycles:5 cycles
Exposure time at temp.
Extremes:30 minutes.
Salt Spray
Shall meet visual requirement, show
no physical damage.
Subject mated connectors to 8 hours
Min. at 35°C with 5% Salt solution
concentration.
Humidity
No appearance damaged
Contact resistance: 5.2.1 Max.
Meet Dielectric strength 5.2.3 Test.
Insulation resistance: 5.2.2 Min.
Mate a dummy card and expose to
60±2°C for 96 hours relative
humidity 90. Upon completion of the
exposure period, the test specimens
shall be conditioned at ambient room
conditions for 1 to 2 hours, after
which the specified measurements
shall be performed.
(EIA-364-31, Test Condition A
Method III, or MIL-202F, Method
103B Test Condition B.)
Heat Resistance
No appearance damaged
Contact resistance: 5.2.1 Max.
Mate a dummy card and expose to
70±2°C for 96 hours.
Upon completion of the exposure
period, the test specimens shall be
conditioned at ambient room
conditions for 1 to 2 hours, after
which the specified measurements
shall be performed.
(EIA 364-17 Test Condition 3 Method
A)



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