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115G датащи(PDF) 3 Page - ATTEND Technology Inc. |
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115G датащи(HTML) 3 Page - ATTEND Technology Inc. |
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3 / 5 page ![]() The information contained herein is exclusive property of. Do not copy and print except that Attend accepts. 本文件係屬立威科技股份有限公司所有;非經同意,不得以任何覆寫、拷貝、翻印等方式私自據有。亦不得擅加毀損、塗改。 -3 - Durability 1).Shall meet visual requirement, show no physical damage. 2).Shall meet requirements of additional tests as specified in TEST SEQUENCE in Section 5 Insertion and extraction are repeated 5000 cycles with the actually card at the speed rate of 400 ~ 600 cycles/hour. Exchange the actually card every 2000 cycles. (EIA 364-09) Contact Retention Force 0.3±0.15Kgf Shall be measured with TENSION GAUGE or TENSION TESTER in same direction (EIA 364-35) ENVIRONMENTAL Item Requirement Test Condition Thermal Shock 1).No evidence of damage 2).The electrical performances should meet the spec. Specified. Subject mated connectors should be tested according to the condition listed below: Temperature:-55 to +85°C Cycles:5 cycles Exposure time at temp. Extremes:30 minutes. Salt Spray Shall meet visual requirement, show no physical damage. Subject mated connectors to 8 hours Min. at 35°C with 5% Salt solution concentration. Humidity No appearance damaged Contact resistance: 5.2.1 Max. Meet Dielectric strength 5.2.3 Test. Insulation resistance: 5.2.2 Min. Mate a dummy card and expose to 60±2°C for 96 hours relative humidity 90. Upon completion of the exposure period, the test specimens shall be conditioned at ambient room conditions for 1 to 2 hours, after which the specified measurements shall be performed. (EIA-364-31, Test Condition A Method III, or MIL-202F, Method 103B Test Condition B.) Heat Resistance No appearance damaged Contact resistance: 5.2.1 Max. Mate a dummy card and expose to 70±2°C for 96 hours. Upon completion of the exposure period, the test specimens shall be conditioned at ambient room conditions for 1 to 2 hours, after which the specified measurements shall be performed. (EIA 364-17 Test Condition 3 Method A) |
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