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PCA9516APW датащи(PDF) 9 Page - NXP Semiconductors

номер детали PCA9516APW
подробное описание детали  5-channel I2C hub
PDF  13 Pages
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производитель  PHILIPS [NXP Semiconductors]
домашняя страница  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

PCA9516APW датащи(HTML) 9 Page - NXP Semiconductors

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Philips Semiconductors
Product data sheet
PCA9516A
5-channel I2C hub
2004 Sep 29
9
AC ELECTRICAL CHARACTERISTICS
VCC = 2.3 V to 2.7 V
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP.2
MAX.
UNIT
tPHL
Propagation delay
Waveform 1
45
93
150
ns
tPLH
Propagation delay
Waveform 1; Note 1
33
90
135
ns
tTHL
Transition time
Waveform 1
—
60
—
ns
tTLH
Transition time
Waveform 1; Note 1
—
131
—
ns
tSET
Enable to Start condition
100
—
—
ns
tHOLD
Enable after Stop condition
130
—
—
ns
NOTES:
1. Different load resistance and capacitance will alter the RC time constant, thereby changing the propagation delay and transition times.
2. Typical value taken at 2.5 V and 25
°C.
AC ELECTRICAL CHARACTERISTICS
VCC = 3.0 V to 3.6 V
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP.2
MAX.
UNIT
tPHL
Propagation delay
Waveform 1
45
75
120
ns
tPLH
Propagation delay
Waveform 1; Note 1
33
60
83
ns
tTHL
Transition time
Waveform 1
—
47
—
ns
tTLH
Transition time
Waveform 1; Note 1
—
130
—
ns
tSET
Enable to Start condition
100
—
—
ns
tHOLD
Enable after Stop condition
100
—
—
ns
NOTES:
1. Different load resistance and capacitance will alter the RC time constant, thereby changing the propagation delay and transition times.
2. Typical value taken at 3.3 V and 25
°C.
AC WAVEFORMS
3.3 V
0.1 V
1.5 V
1.5 V
INPUT
OUTPUT
3.3 V
VOL
tPHL
tPLH
80%
20%
1.5 V
1.5 V
80%
20%
tTHL
tTLH
SW00646
Waveform 1.
TEST CIRCUIT
DEFINITIONS
RL = Load resistor; 1.35 kΩ
CL = Load capacitance includes jig and probe capacitance;
50 pF
RT = Termination resistance should be equal to ZOUT of
pulse generators.
PULSE
GENERATOR
VIN
D.U.T.
VOUT
CL
VCC
RL
Test Circuit for Open Drain Outputs
RT
SW02280
VCC
Figure 7. Test circuit



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