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NB3N551 датащи(PDF) 2 Page - ON Semiconductor |
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NB3N551 датащи(HTML) 2 Page - ON Semiconductor |
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2 / 5 page ![]() NB3N551 http://onsemi.com 2 OE 1 0 Function Enable Disable Table 1. OE, Output Enable Function PIN DESCRIPTION Pin # Name Type Description 1 ICLK (LV)CMOS/(LV)TTL Input Clock Input. Internal pull−up resistor. 2 Q1 (LV)CMOS/(LV)TTL Output Clock Output 1 3 Q2 (LV)CMOS/(LV)TTL Output Clock Output 2 4 Q3 (LV)CMOS/(LV)TTL Output Clock Output 3 5 Q4 (LV)CMOS/(LV)TTL Output Clock Output 4 6 GND Power Negative supply voltage; Connect to ground, 0 V 7 VDD Power Positive supply voltage (3.0 V to 5.5 V) 8 OE (LV)CMOS/(LV)TTL Input Output Enable for the clock outputs. Outputs are enabled when HIGH or when left open; OE pin has internal pull−up resistor. Three−states outputs when LOW. MAXIMUM RATINGS Symbol Parameter Condition 1 Condition 2 Rating Units VDD Positive Power Supply GND = 0 V − 7.0 V VI/VO Input/Output Voltage t ≤ 1.5 ns − GND–1.5 ≤ VI/VO ≤ VDD+1.5 V TA Operating Temperature Range, Industrial − − ≥ −40 to ≤ +85 _C Tstg Storage Temperature Range − − −65 to +150 _C qJA Thermal Resistance (Junction−to−Ambient) 0 LFPM 500 LFPM SOIC−8 190 130 _C/W _C/W qJC Thermal Resistance (Junction−to−Case) (Note 1) SOIC−8 41 to 44 _C/W qJA Thermal Resistance (Junction−to−Ambient) 0 LFPM 500 LFPM DFN−8 DFN−8 129 84 _C/W Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) ATTRIBUTES Characteristic Value ESD Protection Human Body Model Machine Model > 4 kV > 200 V Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2) Level 1 Flammability Rating Oxygen Index: 28 to 34 UL−94 code V−0 @ 0.125 in Transistor Count 531 Devices Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test 2. For additional Moisture Sensitivity information, refer to Application Note AND8003/D. |
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