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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AM29SL400D датащи(PDF) 27 Page - SPANSION |
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AM29SL400D датащи(HTML) 27 Page - SPANSION |
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27 / 41 page  April 13, 2005 Rev. A Amend. +1 Am29SL400D 25 ADV ANCE I N FO RMAT I O N TEST CONDITIONS Table 7. Test Specifications Key to Switching Waveforms CL Device Under Test Figure 11. Test Setup Test Condition All Speed Options Unit Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0–2.0 V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 2.0 V 0.0 V 1.0 V 1.0 V Output Measurement Level Input Figure 12. Input Waveforms and Measurement Levels |
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