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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AM29BDS128HE9 датащи(PDF) 57 Page - SPANSION |
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AM29BDS128HE9 датащи(HTML) 57 Page - SPANSION |
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57 / 89 page  May 10, 2006 27024B3 Am29BDS128H/Am29BDS640H 55 D A TA SH EE T TEST CONDITIONS Table 24. Test Specifications KEY TO SWITCHING WAVEFORMS SWITCHING WAVEFORMS CL Device Under Test Figure 12. Test Setup Test Condition All Speed Options Unit Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 3 ns Input Pulse Levels 0.0–VIO V Input timing measurement reference levels VIO/2 V Output timing measurement reference levels VIO/2 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) Figure 13. Input Waveforms and Measurement Levels VIO 0.0 V Output Measurement Level Input VIO/2 VIO/2 All Inputs and Outputs |
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