MS32 datasheet(2/9 Pages) TI

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Absolute Maximum Ratings

(1)

Recommended Operating Conditions

(1)

SN74AUC32

QUADRUPLE 2-INPUT POSITIVE-OR GATE

SCES513A – NOVEMBER 2003 – REVISED MARCH 2005

over operating free-air temperature range (unless otherwise noted)

MIN

MAX

UNIT

VCC

Supply voltage range

–0.5

3.6

Input voltage range(2)

–0.5

3.6

Voltage range applied to any output in the high-impedance or power-off state(2)

–0.5

3.6

Output voltage range(2)

–0.5

VCC + 0.5

IIK

Input clamp current

VI < 0

–50

IOK

Output clamp current

VO < 0

–50

Continuous output current

±20

Continuous current through VCC or GND

±100

Package thermal impedance(3)

°C/W

Tstg

Storage temperature range

–65

150

°C

(1)

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating

conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.

(3)

The package thermal impedance is calculated in accordance with JESD 51-5.

MIN

MAX

UNIT

VCC

Supply voltage

0.8

2.7

VCC = 0.8 V

VCC

VIH

High-level input voltage

VCC = 1.1 V to 1.95 V

0.65 × VCC

VCC = 2.3 V to 2.7 V

1.7

VCC = 0.8 V

VIL

Low-level input voltage

VCC = 1.1 V to 1.95 V

0.35 × VCC

VCC = 2.3 V to 2.7 V

0.7

Input voltage

3.6

Output voltage

VCC

VCC = 0.8 V

–0.7

VCC = 1.1 V

–3

IOH

High-level output current

VCC = 1.4 V

–5

VCC = 1.65 V

–8

VCC = 2.3 V

–9

VCC = 0.8 V

0.7

VCC = 1.1 V

IOL

Low-level output current

VCC = 1.4 V

VCC = 1.65 V

VCC = 2.3 V

VCC = 0.8 V to 1.65 V(2)

∆t/∆v

Input transition rise or fall rate

VCC = 1.65 V to 2.3 V(3)

ns/V

VCC = 2.3 V to 2.7 V(3)

Operating free-air temperature

–40

°C

(1)

All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

(2)

The data was taken at CL = 15 pF, RL = 2 kΩ (see Figure 1).

(3)

The data was taken at CL = 30 pF, RL = 500 Ω (see Figure 1).

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