IP431AI datasheet(4/7 Pages) SEME-LAB

4 / 7 page

IP431A Series

Semelab plc. Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.

Prelim. 2/95

FIGURE 2

TEST CIRCUIT FOR VKA > VREF

FIGURE 3

TEST CIRCUIT FOR Ioff

FIGURE 1

TEST CIRCUIT FOR VKA = VREF

|Zka| ≈ |Zka| 1+

NOTE 1

The deviation parameter

∆V

REF is defined as the differences between

the maximum and minimum values obtained over the full operating

ambient temperature range that applies.

The average temperature coefficient of the reference input voltage,

∝V

REF is defined as:

∝V

REF can be positive or negative depending on whether ∝VREF Min

∝V

REF Max occurs at the lower ambient temperature.

REF

VMin

REF

Max

AMBIENT TEMPERATURE

∆V

REF

(

) x 106

ppm

VREF @ 25°C

∝V

REF =

°C

∆T

∆V

REF x 10

= ∆T

A (VREF @ 25°C)

Example:

∆V

REF = 8.0 mV and slope is positive,

VREF @ 25°C = 2.495V, ∆TA = 70°C

0.008 x 106 = 45.8 ppm/°C

∝V

REF =

= 45.8 ppm/°C

70 (2.495)

NOTE 2

The dynamic impedance Zka is defined as:

∆V

|Zka| = ∆I

When the device is programmed with two external resistors, R1 and

R2, (refer to Figure 2) the total dynamic impedance of the circuit is

defined as:

(

)

REF

Input

REF

Input

off

Input

REF

∆V

REF =VREF Max -

VREF Min

∆T

A = T2 - T1

VKA = VREF 1+

+ IREF x R1

(

)

IP431AI датащи(PDF) 4 Page - Seme LAB

IP431AI датащи(HTML) 4 Page - Seme LAB

Html Pages

1 2 3 4 5 6 7

датащи скачать

ссылки URL