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AD5378ABC датащи(PDF) 27 Page - Analog Devices |
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AD5378ABC датащи(HTML) 27 Page - Analog Devices |
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27 / 28 page ![]() Preliminary Technical Data AD5378 Rev. PrA | Page 27 of 28 TYPICAL APPLICATION CIRCUIT The high channel count of the AD5378 makes it wellsuited to applications requiring high levels of integration such as optical and automatic test equipment (ATE) systems. Figure 22 shows the AD5378 as it is used in an ATE system. Shown here is one pin of a typical logic tester. It is apparent that a number of discrete levels are required for the pin driver, active load circuit, parametric measurement unit, comparators, and clamps. In addition to the DAC levels required in the ATE system shown, drivers, loads, comparators, and parametric measurement unit functions are also required. Analog Devices provides solutions for all these functions. DAC CENTRAL PMU DRIVEN SHIELD VCH VTH VTL IOL VCOM IOH VCL VH VL DRIVER COMP ACTIVE LOAD FORMATTER DE-SKEW COMPARE MEMORY TIMING DATA MEMORY TIMING GENERATOR DLL LOGIC FORMATTER DE-SKEW VTERM PPMU RELAYS GND SENSE DEVICE POWER SUPPLY 50 Ω COAX DUT GUARD AMP DAC DAC DAC DAC DAC DAC DAC DAC DAC DAC ADC DAC ADC DAC ADC Figure 22. Typical Application Circuit for Logic Tester |
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