89C52 datasheet(21/32 Pages) PHILIPS

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Philips Semiconductors

Product specification

89C51/89C52/89C54/89C58

80C51 8-bit microcontroller family

4K/8K/16K/32K Flash

1999 Oct 27

DC ELECTRICAL CHARACTERISTICS

Tamb = 0°C to +70°C or –40°C to +85°C; 5 V ±10%; VSS = 0 V

SYMBOL

PARAMETER

TEST

LIMITS

UNIT

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP1

MAX

UNIT

VIL

Input low voltage

4.5 V < VCC < 5.5 V

–0.5

0.2 VCC–0.1

VIH

Input high voltage (ports 0, 1, 2, 3, EA)

0.2 VCC+0.9

VCC+0.5

VIH1

Input high voltage, XTAL1, RST

0.7 VCC

VCC+0.5

VOL

Output low voltage, ports 1, 2, 3 8

VCC = 4.5 V

IOL = 1.6 mA2

0.4

VOL1

Output low voltage, port 0, ALE, PSEN 7, 8

VCC = 4.5 V

IOL = 3.2 mA2

0.4

VOH

Output high voltage, ports 1, 2, 3 3

VCC = 4.5 V

IOH = –30 µA

VCC – 0.7

VOH1

Output high voltage (port 0 in external bus mode),

ALE9, PSEN3

VCC = 4.5 V

IOH = –3.2 mA

VCC – 0.7

IIL

Logical 0 input current, ports 1, 2, 3

VIN = 0.4 V

–1

–75

µA

ITL

Logical 1-to-0 transition current, ports 1, 2, 36

VIN = 2.0 V

See Note 4

–650

µA

ILI

Input leakage current, port 0

0.45 < VIN < VCC – 0.3

±10

µA

ICC

Power supply current (see Figure 21):

See Note 5

Active mode (see Note 5)

Idle mode (see Note 5)

Power-down mode or clock stopped (see Figure 25

diti

)

Tamb = 0°C to 70°C

100

µA

for conditions)

Tamb = –40°C to +85°C

125

µA

RRST

Internal reset pull-down resistor

225

Ω

CIO

Pin capacitance10 (except EA)

NOTES:

1. Typical ratings are not guaranteed. The values listed are at room temperature, 5 V.

2. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the VOLs of ALE and ports 1 and 3. The noise is due

to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations. In the

worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable to qualify

ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. IOL can exceed these conditions provided that no

single output sinks more than 5 mA and no more than two outputs exceed the test conditions.

3. Capacitive loading on ports 0 and 2 may cause the VOH on ALE and PSEN to momentarily fall below the VCC–0.7 specification when the

address bits are stabilizing.

4. Pins of ports 1, 2 and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its

maximum value when VIN is approximately 2 V.

5. See Figures 22 through 25 for ICC test conditions and Figure 21 for ICC vs Freq.

Active mode:

ICC(MAX) = (0.9 × FREQ. + 20)mA

Idle mode:

ICC(MAX) = (0.37 × FREQ. +1.0)mA

6. This value applies to Tamb = 0°C to +70°C.

7. Load capacitance for port 0, ALE, and PSEN = 100pF, load capacitance for all other outputs = 80 pF.

8. Under steady state (non-transient) conditions, IOL must be externally limited as follows:

Maximum IOL per port pin:

15 mA (*NOTE: This is 85

°C specification.)

Maximum IOL per 8-bit port:

26 mA

Maximum total IOL for all outputs:

71 mA

If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed

test conditions.

9. ALE is tested to VOH1, except when ALE is off then VOH is the voltage specification.

10. Pin capacitance is characterized but not tested. Pin capacitance is less than 25 pF. Pin capacitance of ceramic package is less than 15 pF

(except EA is 25 pF).

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