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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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89C535 датащи(PDF) 21 Page - NXP Semiconductors |
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89C535 датащи(HTML) 21 Page - NXP Semiconductors |
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21 / 35 page  Philips Semiconductors Preliminary specification 89C535/89C536/89C538 CMOS single-chip 8-bit microcontrollers with FLASH program memory 1997 Jun 05 21 VCC–0.5 0.45V 0.2VCC+0.9 0.2VCC–0.1 NOTE: AC inputs during testing are driven at VCC –0.5 for a logic ‘1’ and 0.45V for a logic ‘0’. Timing measurements are made at VIH min for a logic ‘1’ and VIL max for a logic ‘0’. SU00717 Figure 14. AC Testing Input/Output VLOAD VLOAD+0.1V VLOAD–0.1V VOH–0.1V VOL+0.1V NOTE: TIMING REFERENCE POINTS For timing purposes, a port is no longer floating when a 100mV change from load voltage occurs, and begins to float when a 100mV change from the loaded VOH/VOL level occurs. IOH/IOL ≥ ±20mA. SU00718 Figure 15. Float Waveform SU00886 TYP ACTIVE MODE MAX IDLE MODE TYP IDLE MODE MAX ACTIVE MODE 30.00 20.00 10.00 4812 16 FREQ AT XTAL1 (MHz) 20 24 28 32 36 0.00 40.00 50.00 60.00 70.00 80.00 90.00 0 Figure 16. ICC vs. FREQ Valid only within frequency specifications of the device under test |
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